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Dynamics of Defect Annihilation in Vitrified Liquid Crystalline (VLC) Thin Films Upon Thermal Annealing

Published online by Cambridge University Press:  10 February 2011

H. Shi
Affiliation:
Center for Optoelectronic & Imaging, and Laboratory for Laser Energetics, 240 E. River Road, University of Rochester, Rochester, NY 14623–1212
D. Katsis
Affiliation:
Center for Optoelectronic & Imaging, and Laboratory for Laser Energetics, 240 E. River Road, University of Rochester, Rochester, NY 14623–1212
S. H. Chen
Affiliation:
Center for Optoelectronic & Imaging, and Laboratory for Laser Energetics, 240 E. River Road, University of Rochester, Rochester, NY 14623–1212
M. E. De Rosa
Affiliation:
Wright Laboratory, MLPJ, 3005 P Street Suite 1, Wright-Patterson AFB, OH 45433–7702
W. W. Adams
Affiliation:
Wright Laboratory, MLPJ, 3005 P Street Suite 1, Wright-Patterson AFB, OH 45433–7702
T. J. Bunning
Affiliation:
Science Applications International Corp., 101 Woodman Dr. Suite 103, Dayton, OH 45431
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Abstract

Based on a series of model nematic and chiral-nematic compounds as well as a polymer analog, it was found that the annihilation of defects in a VLC system occurs at a much faster rate than its polymer analog. In chiral-nematic blends, the degree of structural similarity between the nematic host and the chiral dopant plays an important role; a wider biphasic region contributes to a slower annihilation process.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

[1] Shi, H. and Chen, S. H., Liquid Crystals, 17, 413 (1994).Google Scholar
[2] Shi, H. and Chen, S. H., Liquid Crystals, 18, 733 (1995).Google Scholar
[3] Chen, S. H., Mastrangelo, J. C., Shi, H., Bashir-Hashemi, A., Li, J., and Gelber, N., Macromolecules, 28, 7775 (1995).Google Scholar
[4] Shi, H. and Chen, S. H., Liquid Crystals, 19, 849 (1995).Google Scholar
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[6] Shi, H., Chen, S. H., De Rosa, M. E., Bunning, T. J., and Adams, W. W., Liquid Crystals, 20, 277 (1996).Google Scholar
[7] Shi, H. and Chen, S. H., Macromolecules, 26, 5840 (1993).Google Scholar