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Dynamics of Buried Polymer -polymer Interfaces in Thin Films

Published online by Cambridge University Press:  01 February 2011

L. B. Lurio ,
Xuesong Hu ,
Suresh Narayanan ,
Xuesong Jiao  and
Jyotsana Lal
L. B. Lurio
Affiliation:
Department of Physics, Northern Illinois University, DeKalb IL 60115
Xuesong Hu
Affiliation:
PNS, Argonne National Laboratory, Argonne IL, 60439
Suresh Narayanan
Affiliation:
APS, Argonne National Laboratory, Argonne IL, 60439
Xuesong Jiao
Affiliation:
Department of Physics, Northern Illinois University, DeKalb IL 60115
Jyotsana Lal
Affiliation:
PNS, Argonne National Laboratory, Argonne IL, 60439
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Abstract

We have performed x-ray photon correlation spectroscopy (XPCS) measurements on a polymer-bilayer system comprised of 100 nm polystyrene film on top of an 80 nm polybromostyrene film, supported on a Si substrate. In order to distinguish the dynamics at the top interface from that at the polymer-polymer interface we have performed the measurement at grazing incidence. In this geometry, a standing wave is set up in the film. We derive a relation for the intensity of the standing wave and the resulting diffuse scattering. This model is compared with the measured diffuse scattering from which we extract a value of 0.7±0.4 dyne/cm for the surface tension between PS and PBrS at 180C. XPCS was then measured in each of two standing wave conditions, first where diffuse scattering only occurs at the polymer-vacuum interface and then where it only occurs at the interior polymer-polymer interface. The measured time correlation functions for each of the two interfaces show clear differences, with the polymer-polymer interface exhibiting much slower dynamics.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 790: Symposium P – Dynamics in Small Confining Systems–2003 , 2003 , P7.43
Copyright
Copyright © Materials Research Society 2004

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References

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