Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-27T02:34:10.091Z Has data issue: false hasContentIssue false

Dynamic Pathway Models for Ion Transport in Nanostructured Heterolayers

Published online by Cambridge University Press:  01 February 2011

Stefan Adams
Affiliation:
[email protected], National University of Singapore, Materials Science and Engineering, 7 Engineerin-Drive-1, E3A 04 02, Sinagpore, 117574, Singapore, +65 6516 6969, +65 6776 3604
Esther S Tan
Affiliation:
[email protected], National University of Singapore, Materials Science and Engineering, 7 Engineering Drive 1, Singapore, 117574, Singapore
Get access

Abstract

The influence of local structure variations on the charge transport properties are still not well understood at an atomic level. In this work the experimentally observed drastic conductivity enhancement in epitactic stacks of BaF2:CaF2 heterolayers compared to any of the two fluoride ion conducting phases is reproduced by molecular dynamics simulations and analyzed in detail with particular emphasis on the variation of properties with the distance to the two-phase boundary. Ion mobility varies with the distance to the interface but remains significantly enhanced throughout the modeled layers when compared to bulk materials.

The bond valence method is utilized to study correlations between the conductivity enhancement and the microstructure. A time-averaged violation of local electroneutrality postulated in the mesoscopic multiphase model is verified by the bond valence analysis of the molecular dynamics simulation trajectories. The variation of the ion mobility can be related to the extension of clusters of unoccupied accessible pathway regions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lee, J.S., Adams, S., and Maier, J.; J. Electrochem. Soc. 147, 2407 (2000).Google Scholar
2. Sata, N., Eberman, K., Eberl, K. and Maier, J.; Nature 408, 946 (2000).Google Scholar
3. Sayle, D.C., Doig, J.A., Parker, S.C., Watson, G.W.; Chem. Commun., 2003, 1804.Google Scholar
4. Sayle, D. C., Doig, J. A., Parker, S.C., Watson, G.W. and Sayle, T.X.T., Phys. Chem. Chem. Phys. 7, 16 (2005).Google Scholar
5. Adams, S.; Solid State Ionics 177, 1625 (2006).Google Scholar
6. Adams, S. & Swenson, J.; Ionics 10, 396 (2004).Google Scholar
7. Adams, S.. Bull. Mater. Sci. 29, 587 (2006).Google Scholar
8. Jin-Philipp, N. Y., Sata, N., Maier, J., Scheu, C., Hahn, K., Kelsch, M. and Rühle, M., J. Chem. Phys. 120, 2375 (2004).Google Scholar
9. Adams, S., http:// kristall.uni-mki.gwdg.de/softBVGoogle Scholar