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Dual-probe scanning tunneling microscope and a carbon nanotube ring transistor

Published online by Cambridge University Press:  11 February 2011

Taishi Shigematsu
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd., 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Hiroyuki Watanabe
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd., 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Chikara Manabe
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd., 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Kei Shimotani
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd., 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
Masaaki Shimizu
Affiliation:
Ecology Research Laboratory, Corporate Research Laboratory, Fuji Xerox Co., Ltd., 1600, Takematsu, Minamiashigara-shi, Kanagawa-ken, 250–0111, JAPAN
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Abstract

For measuring molecular device, we developed a dual-probe scanning tunneling microscope (D-STM) composed of two STM systems in which a carbon nanotube (NT) was used for STM tip. Using D-STM, we fabricated a NT ring device. The NT ring device showed a switching behavior with applying gate bias. Furthermore, in STM imaging for various gate biases, we could observe directly hole injection into the NT ring.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

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