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Dual-Beam Photocurrent Spectra in Undoped a-Si:H

Published online by Cambridge University Press:  01 January 1993

J.Z Liu ,
G. Lewen ,
J.P. Conde  and
P. Rocai Cabarrocas
J.Z Liu
Affiliation:
NEC Research Institute, 4 Independence Way, Princeton, NJ 08540,
G. Lewen
Affiliation:
NEC Research Institute, 4 Independence Way, Princeton, NJ 08540,
J.P. Conde*
Affiliation:
NEC Research Institute, 4 Independence Way, Princeton, NJ 08540,
P. Rocai Cabarrocas
Affiliation:
LPICM, Ecole Polytechnique, 91128 Palaiseau Cedex, France
*
§ On leave from Instituto Superior Tecnico, 1096 Lisboa Codex - Portugal.
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Abstract

It is shown that the anomalous band in dual-beam CPM (DBCPM) spectra results from a combination of two processes: photocurrent enhancement due to excitations by the probe light from the valence baud to theD+ defect states, and photocurrent reduction due to excitations by the probe light from the D° defect states to the conduction band. From the DBCPM spectra, the electron correlation energy for the (filled)D - defects is determined to be 0.25 eV.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 297: Symposium A – Amorphous Silicon Technology - 1993 , 1993 , 473
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

[1] Kocka, J., Vanecek, M., and Triska, A., in Amorphous Silicon and Related Materials, ed. by Fritzsche, H. (World Scientific, Singapore, 1988) p. 297, and references therein.Google Scholar
[2] Wronski, C.R., Abeles, B., Tiedje, T., and Cody, G.D., Solid State Comm. 44, 1423 (1982).Google Scholar
[3] Lee, S., Kumar, S., and Wronski, C.R., J. Non-Crystal. Solids 114, 316 (1989).Google Scholar
[4] Persans, P.D., Phil. Mag. B 46, 435 (1982).Google Scholar
[5] Aljishi, S., Ley, L., Chu, V., Tanaka, S., Smith, Z E., and Wagner, S., Proc. 19th Int. Conf. Phys. Semicon., ed. by Zawadzki, W. (Inst, of Phys., Wasaw, 1988), p. 1637.Google Scholar
[6] Liu, J.Z., Conde, J.P., Lewen, CI., and Cabarrocas, P. Roca i, Amorphous Silicon Technology-1992, MRS Symp. Proc. Vol. 258, ed. by Thompson, M.J., Hamakawa, Y., LeComber, P.G., Madan, A., Schiff, E. (MRS, Pittsburgh, 1992), p. 795.Google Scholar
[7] Cabarrocas, P. Roca i, Chevrier, J.B., Hue, J., Lloret, A., Parey, J.Y., and Schmitt, J.P.M., J. Vac. Sci. Technol. A 9, 2331 (1991).Google Scholar
[8] Wronski, C. R., Lee, S., Hicks, M., and Kumar, S., Phys. Rev. Lett. 63, 1420 (1989).Google Scholar
[9] Jackson, W.B., Kelso, S.M., Tsai, C.C., Allen, J.W., and Oh, S.-J., Phys. Rev. B 31, 5187 (1985).Google Scholar
[10] Curtins, H. and Favre, M., in Amorphous Silicon and Related Materials, ed. by Fritzsche, H. (World Scientific, Singapore, 1988), p. 329.Google Scholar
[11] Park, H., Liu, J.Z., and Wagner, S., Appl. Phys. Lett. 55, 2638 (1989).Google Scholar
[12] Stutzmann, M., Nunnenkamp, J., Brandt, M.S., and Asano, A., Phys. Rev. Lett. 67, 2347 (1991).Google Scholar
[13] Rose, A., Concepts in Photoconductivity and Allied Problems (R. Krieger Publishing, Huntington, 1978), §3.10.Google Scholar
[14] Street, R.A., Hydrogenated Amorphous Silicon (Cambridge University, Cambridge, 1991), Chapter 8.Google Scholar
[15] Fuhs, W., J. Non-Crystal. Solids 77 & 78, 583 (1985).Google Scholar
[16] Morigaki, K., J. Non-Crystal. Solids 77 & 78, 592 (1985).Google Scholar
[17] McMahon, T.J. and Crandall, R., Phys. Rev. B 39, 1766 (1989).Google Scholar
[18] Simmons, J.G. and Taylor, G.W., Phys. Rev. B 4, 502 (1971).Google Scholar
[19]The specified uncertainty includes only the uncertainty for fitting the specified func¬tion to the data. That is, it does not includes the error of the data.Google Scholar