Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-25T16:32:34.276Z Has data issue: false hasContentIssue false
  • English
  • Français

Does the Latent Track Occurrence in Amorphous Materials Result from a Transient Thermal Process?

Published online by Cambridge University Press:  10 February 2011

M. Toulemonde ,
Ch. Dufour ,
E. Paumier  and
F. Pawlak
M. Toulemonde
Affiliation:
CIRIL (CEA/CNRS), BP 5133, 14070 Caen Cedex 5 (France), [email protected]
Ch. Dufour
Affiliation:
LERMAT-ISMRA (ESA 6004 CNRS), 6 Bd du Maréchal Juin, 14050 Caen Cedex (France)
E. Paumier
Affiliation:
CIRIL (CEA/CNRS), BP 5133, 14070 Caen Cedex 5 (France), [email protected] LERMAT-ISMRA (ESA 6004 CNRS), 6 Bd du Maréchal Juin, 14050 Caen Cedex (France)
F. Pawlak
Affiliation:
CIRIL (CEA/CNRS), BP 5133, 14070 Caen Cedex 5 (France), [email protected]
Get access

Abstract

Heavy ion irradiations in the electronic stopping power (Se.) regime have been performed in amorphous materials. Latent tracks have been observed in amorphous semiconductors (a-Ge, a-Si) and their radii have been deduced from a phenomenological analysis in an amorphous metallic alloy, in vitreous silica and “polymer” like amorphous carbon. A transient thermal model is developed describing the energy diffusion by the electron gas, by the atomic lattice and the energy exchange between the two subsystems. According to Fick's law, the classical equations of heat flow in the two subsystems (electrons and atoms) are numerically solved in a cylindrical geometry taking into account the temperature dependence of all the parameters. A simulation of annealing of nuclear collisions induced defects in crystalline iron allows to determine a local temperature. Electronic defect creation occurs when Se. increases and becomes larger than a threshold which is correlated with the appearance of a molten phase. Using such a criterion, the radii of latent tracks are reproduced in both a - Ge and a - Si with the same value of the electron-phonon coupling despite large differences in their lattice thermodynamic parameters. Such a model is applied to amorphous metallic alloy Fe85B15, vitreous silica and amorphous carbon.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 504: Symposium KK – Atomistic Mechanisms in Beam Synthesis & Irradiation… , 1997 , 99
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Desauer, F., Z. Physik, 12(1923)Google Scholar
2. Seitz, F. and Koehler, J.S., Sol. St. Phys. -Z 2 305(1956)Google Scholar
3. Fleisher, R.L., Price, P.B. and Walker, R.M., Nuclear Tracks in Solids, University of California Press, (1975)Google Scholar
4. Izui, K. and Furuno, K.S., Proc, XIth Int. Cong. On Electron Microscopy (Kyoto 1986)1299Google Scholar
5. Audouard, A., Balanzat, E., Fuchs, G., Jousset, J.C., Lesueur, D. and Thomé, L., Europhys.Lett. 3 327(1987)Google Scholar
6. Audouard, A., Balanzat, E., Fuchs, G., Jousset, J.C., Lesueur, D. and Thomé, L., Europhys.Lett. 5, 241(1988)Google Scholar
7. Dunlop, A., Lesueur, D., Legrand, P., Dammak, H. and Dural, J., Nucl. Instr. Meth. Phys. Res. B90, 330(1994)Google Scholar
8. Dunlop, A., Lesueur, D., Morillo, J., Dural, J., Spohr, R. and Vetter, J., C.R. Acad. Sci. Paris 309. 1277(1989)Google Scholar
9. Meftah, A., Brisard, F., Costantini, J.M., Dooryhée, E., Hage-Ali, M., Hervieu, M., Stoquert, J.P., Studer, F. and Toulemonde, M., Phys. Rev. B49, 12457(1994)Google Scholar
10. Klaumufnzer, S., Schumacher, G., Changlin, Li, Löffler, S., Rammensee, M. and Neitzert, H.C., Rad. Eff. Def. Sol. 108, 131(1989)Google Scholar
11. Benyagoub, A., Löffler, S., Rammensee, M., Klaumunzer, S. and Saemann-Ischenko, G., Nucl. Instr. Meth. Phys. Res. B65. 228(1992)Google Scholar
12. Sigrist, A. and Balzer, R., Helv. Phys. Acta 50, 49(1977)Google Scholar
13. Toulemonde, M., Dural, J., Nouet, G., Mary, P., Hamet, J.F., Beaufort, M.F., Desoyer, J.C., Blanchard, C. and Auteytner, J., Phys. Stat. Sol. 114, 467(1989)Google Scholar
14. Levalois, M., Bogdanski, P. and Toulemonde, M., Nuci. Instr. Meth. Pys. Res. B63, 14(1992)Google Scholar
15. Tom, H.W.K., Aumiller, G.D. and Broto-Cruz, C.H., Phys. Rev. Lett. 60, 1438(1988)Google Scholar
16. Saeta, P., Wang, J.K., Siegal, Y., Bloembergen, N. and Mazur, E., Phys. Rev. Lett. 67 1023(1991)Google Scholar
17. Allen, P.B., Phys. Rev. Lett. 5, 1460(1987)Google Scholar
18. Brorson, S.D., Kazeroonian, A., Moodera, J.S., Face, D.W., Cheng, T.K., Ippen, E.P., Dresselhaus, M.S. and Dresselhaus, G., Phys. Rev. Lett. 64, 2172 (1990)Google Scholar
19. Klaumunnzer, S., Hou, Ming-Dong and Schumacher, G., Phys. Rev. Lett. 7 850(1986)Google Scholar
20. Toulemonde, M., Dufour, Ch. and Paumier, E., Phys. Rev. B46, 14362(1992)Google Scholar
21. Szenes, G., Mat. Sc. Forum 22:n 647(1992)Google Scholar
22. Gervais, B. and Bouffard, S., Nucl. Instr. Meth. Phys. Res. B88, 355(1994)Google Scholar
23. Waligorski, M.P.R., Harem, R.N. and Katz, R., Nuci. Tracks Radiat. Meas. 11, 309(1986)Google Scholar
24. Meftah, A., Brisard, F., Costantini, J.M., Hage-Ali, M., Stoquert, J.P., Studer, F. and Toulemonde, M., Phys. Rev. B48 920(1993)Google Scholar
25. Wang, Z.G., Dufour, Ch., Cabeau, B., Dural, J., Fuchs, G., Paumier, E., Pawlak, F. and Toulemonde, M., Nucl. Instr. Meth. Phys. Res. B107 175(1996)Google Scholar
26. Dufour, Ch., Audouard, A., Beneu, F., Dural, J., Girard, J.P., Hairie, A., Levalois, M., Paumier, E. and Toulemonde, M., J. Phys. Condens. Matter 5, 4573(1993)Google Scholar
27. Wang, Z.G., Dufour, Ch., Paumier, E. and Toulemonde, M., J. Phys. Condens. Matter 6. 6733 (1994); 7, 2525(1995)Google Scholar
28. Kaganov, I.M., Lifshitz, I.M. and Tanatarov, L.V., Zh. Tekh. Fiz. 31, 273(1956) [Soy. Phys. JET 4, 173 (1957)]Google Scholar
29. Dufour, Ch., Wang, Z.G., Levalois, M., Marie, P., Paumier, E., Pawlak, F. and Toulemonde, M., Nucl. Instr. Meth. Phys. Res. B107, 218(1996)Google Scholar
30. Dufour, Ch., Paumier, E. and Toulemonde, M., Nuci. Instr. Meth. Phys. Res. B122, 445(1997)Google Scholar
31. Iwase, A., Sasaki, S., Iwata, T. and Nihira, T., Phys. Rev. Lett. 58 2450(1987)Google Scholar
32. Vineyard, G.H., Radiat. Eff. 29, 245(1976)Google Scholar
33. Wang, Z.G., Dufour, Ch., Paumier, E. and Toulemonde, M., NucI. Instr. Meth. Phys. Res. B 115, 577(1996)Google Scholar
34. Iwase, A., Iwata, T., Nihira, T., J. Phys. Soc. Jap. 61, 3878(1992)Google Scholar
35. Dunlop, A. and Lesueur, D., Rad. Eff. Def Sol. 126 123(1993)Google Scholar
36. Audouard, A., Balanzat, E., Jousset, J.C., Lesueur, D. and Thomé, L., J. Phys. Condens. Matt. 5, 995(1993)Google Scholar
37. Audouard, A., Dural, J., Toulemonde, M., Lovas, A., Szenes, G. and Thomé, L., Phys. Rev. B54, 15690(1996)Google Scholar
38. Trautmann, C., Spohr, R. and Toulemonde, M., Nucl. Instr. Meth. Phys. Res. B83. 513(1993)Google Scholar
39. Audouard, A., Dural, J., Toulemonde, M., Lovas, A., Szenes, G. and Thomé, L., Europhys. Lett. to be published.Google Scholar
40. Hou Ming-Dong, Klaumunzer, S. and Schumacher, G. Phys. Rev. B41, 1144(1990)Google Scholar
41. Trinkaus, H. and Ryazanov, A.I., Phys. Rev. Lett. 74 5072(1995)Google Scholar
42. Katin, V.V., Martinenko, Yu. V., Yavlinskii, Yo.V., Soy. Phys. Techn. Lett. 13 276(1987)Google Scholar
43. Toulemonde, M., Costantini, J.M., Dufour, Ch., Meftah, A., Paumier, E. and Studer, F., Nucl Instr. Meth. Phys. Res. 16, 37(1996)Google Scholar
44. Busch, M.C., Slaoui, A., Siffert, P., Dooryhée, E. and Toulemonde, M., J. Appl. Phys. 71 2596(1992)Google Scholar
45. Toulemonde, M., Enault, N., Fan, Jin Yun and Studer, F., J. Appl. Phys. 68, 1545(1990)Google Scholar
46. Trautmann, C., Costantini, J.M., Meftah, A., Schwartz, K., Stoquert, J.P. and Toulemonde, M., present symposium.Google Scholar
47. Pawlak, F., Balanzat, E., Dufour, Ch., Laurent, A., Paumier, E., Perriere, J., Stoquert, J.P. and Toulemonde, M., Nuci. Instr. Meth. Phys. Res. B122, 579(1997)Google Scholar
48. Pawlak, F., Dufour, Ch., Laurent, A., Paumier, E., Perriere, J., Stoquert, J.P. and Toulemonde, M., Nucl. Instr. Meth. Phys. Res. 131, 135(1997)Google Scholar
49. Lewis, M.B. and Lee, E.H., J. Nucl. Mat. 203 224(1993)Google Scholar