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Dislocation - Grain Boundary Interaction in Nickel Bicrystals Evolution of the Resulting Defects under Thermal Treatment

Published online by Cambridge University Press:  21 March 2011

Louisette Priester ,
Sophie Poulat ,
Brigitte Décamps  and
Jany Thibault
Louisette Priester
Affiliation:
Laboratoire d'Etudes des Matériaux Hors Equilibre, UMR 8647, Université ParisSud, 91405 Orsay Cedex, France
Sophie Poulat
Affiliation:
Laboratoire d'Etudes des Matériaux Hors Equilibre, UMR 8647, Université ParisSud, 91405 Orsay Cedex, France
Brigitte Décamps
Affiliation:
Laboratoire de Chimie Métallurgique des Terres Rares, UPR 209 du CNRS, Groupe des LaboratoiresdeVitry-Thiais, 2-8 rue Henri Dunant, 94320 Thiais Cedex, France
Jany Thibault
Affiliation:
CEA/ Département de Recherche Fondamentale sur la Matiére Condensée, Servicede Physique des Matériaux et Microstructure, 17 rue des Martyrs, 38054 Grenoble Cedex, France
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Abstract

The interactions between lattice dislocations and grain boundaries were studied in nickel bicrystals. Three types of grain boundaries, according to their energy, were investigated : singular σ3 {111}, vicinal near σ11 {311} and general near σ11 {332} grain boundaries. The experiments were performed by transmission electron microscopy using a set of techniques : conventional, weak beam, in situ and high resolution transmission electron microscopy. Dislocation transmission from one crystal to the other was only observed for σ3 {111} GB. It consists in a decomposition within the grain boundary of the trapped lattice dislocation followed by the emission of one partial in the neighbouring crystal. A high resolved shear stress is required to promote the emission process. Most often, the absorbed lattice dislocations or extrinsic grain boundary dislocations react with the intrinsic dislocation network giving rise to complex configurations. The evolutions with time and upon thermal treatment of these configurations were followed by in situ transmission electron microscopy. The evolution processes, which differ with the type of grain boundaries, were analyzed by comparison with the existing models for extrinsic grain boundary dislocation accommodation. They were tentatively interpretated on the basis of the grain boundary atomic structures and defects obtained by high resolution transmission electron microscopy studies.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 652: Symposium Y – Influences of Interface & Dislocation Behavior on Microstructure Evolution , 2000 , Y11.5
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1. Sutton, A.P. and Vitek, V., Phil. Trans. R. Soc. A, 309, 1 (1983).Google Scholar
2. Thibault, J., Putaux, J.L., Jacques, A., George, A., Michaud, H.M. and Baillin, X., Mat.Sci. and Eng., 164, 93 (1993).Google Scholar
3. Bollmann, W., Crystalline Defects and Crystalline Interfaces, Springler Verlag, Heidelberg (1970).Google Scholar
4. Priester, L., Interface Sci., 4, 205 (1997).Google Scholar
5. Pestman, B.J., J.Th.M.De Hasson, Vitek, V. and Schaping, F.W., Phil. Mag. A, 64, 951 (1991).Google Scholar
6. Poulat, S., Décamps, B. and Priester, L., Phil. Mag. A, 77, 1381 (1998).Google Scholar
7. Poulat, S., Décamps, B. and Priester, L., Phil. Mag. A, 79, 2655 (1999).Google Scholar
8. Nazarov, A.A., Romanov, A.E. and Valiev, R.Z., Scripta metall., 24, 1929 (1990).Google Scholar
9. Nazarov, A.A., Romanov, A.E. and Valiev, R.Z., Acta metall. mater., 41, 1033 (1993).Google Scholar
10. Lojkowski, W., Kirchner, H.O.K. and Grabski, M.W., Scripta metall. 11, 1127 (1977).Google Scholar
11. Duparc, O. Hardouin, Poulat, S., Larere, A., Thibault, J. and Priester, L., Phil. Mag.A, 80, 853 (2000).Google Scholar
12. Poulat, S., Thibault, J. and Priester, L., Interface Sci., 8, 5 (2000).Google Scholar
13. Bouchet, D. and Thibault, J., J. Microsc. Microanal. Microstruc., 3, 1 (1992).Google Scholar
14. King, A.H. and Smith, D.A., Acta Cryst. A, 36, 335 (1980).Google Scholar