Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-27T02:17:04.553Z Has data issue: false hasContentIssue false

Direct Evidence of Surface Roughness in Small Metallic Particles

Published online by Cambridge University Press:  15 February 2011

Miguel Jose Yacaman
Affiliation:
Universidad Nacional Autónoma de México,Instituto de Fisica, P.O. Box 20-364, México 01000.
Samuel Tehuacanero
Affiliation:
Universidad Nacional Autónoma de México,Instituto de Fisica, P.O. Box 20-364, México 01000.
Cristina Zorrilla
Affiliation:
Universidad Nacional Autónoma de México,Instituto de Fisica, P.O. Box 20-364, México 01000.
Gabriela Diaz
Affiliation:
Universidad Nacional Autónoma de México,Instituto de Fisica, P.O. Box 20-364, México 01000.
Get access

Abstract

The characterization of nanoparticles is of prime importance in catalysis. High Resolution Electron Microscopy coupled with image processing has produce a lot of new information on the detailed structure of the particles. In this paper we discuss the possibility of applying these techniques to the study of surface roughness.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. José-Yacamán, M. and Avalos, M., Ultramicroscopy, 10, 211 (1983).Google Scholar
2. Yao, M. H. and Smith, D. J., J. of Microscopy, 175, 252 (1994)Google Scholar
3. Fluei, M., Ph D No.796 EPFL, Laussanne, 1989.Google Scholar
4. José-Yacamán, M., Schabes, P., Herrera, R., A. Gómez and S.Tehuacanero, Surf. Sci.,237, 248 (1990).Google Scholar
5. Beltrán del Rio, L. M., Gómez, A. and José, M. in Proceedings of ICEM-13,1, 443 (1994).Google Scholar
6. Paciornik, S., Kilaas, R., Dahmen, U. and O'Keefe, M., Proceedings of 51st Annual EMSA Meeting, p. 458, Ed. by Bailey, G.W. and Riedel, C. L., San Fco. (1993)Google Scholar
7. Saxton, W. O. and Smith, D. J., Ultramicroscopy, 18, 39 (1985).Google Scholar
8. Hardeveld, R. Van and Hartog, F., Surf. Sci., 15, 189 (1969).Google Scholar