Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-05T01:06:32.538Z Has data issue: false hasContentIssue false
  • English
  • Français

Dielectric Properties of Layer Polymer Films

Published online by Cambridge University Press:  15 February 2011

W. Sakai ,
T. Yoshiji ,
N. Tsutsumi  and
C. K. Chiang
W. Sakai
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, JAPAN
T. Yoshiji
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, JAPAN
N. Tsutsumi
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, JAPAN
C. K. Chiang
Affiliation:
Polymers Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8541, U.S.A.
Get access

Abstract

The dielectric and thermal properties of three-layer structured films were studied. The two outer layers were about 1 μm and the thickness of the middle layer was varied. We measured the thickness dependence of the dielectric constant of the three-layer structured films. The dielectric results were evaluated with a simple serial three-capacitance model. Local thermal property of these polymer films were also measured using a micro-tip local thermal analysis method. Local glass transition of the film was compared with the one expected from bulk data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 769: Symposium H – Flexible Electronics - Materials and Device Technology , 2003 , H10.8
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. vanZanten, J. H., Wallace, W. E., Wu, W. L., Phys. Rev. E, 53, R2053 (1996).Google Scholar
2. Orts, W. J, Vanzanten, J. H., Wu, W. L., Satija, S. K., Phys. Rev. Lett., 71(6), 867 (1993).Google Scholar
3. Fukao, K., and Miyamoto, Y., Phys. Rev. E, 61, 1743 (2000)Google Scholar
4. Sakai, W. and Chiang, C. K., Mat. Res. Soc. Symp. Proc., 710, 73 (2002)Google Scholar
5.Certain instruments and materials identified in this paper are to adequately specify experimental details. In no case does it imply endorsement by NIST or that those are necessarily the best for the purposes specifiedGoogle Scholar
6. and, C. K. Chiang Sakai, W., Mat. Res. Soc. Symp. Proc., 699, 197 (2002).Google Scholar
7. Sato, T., Tsujii, Y., Kita, Y., Fukuda, T., Miyamoto, T., Macromolecules, 24, 4691 (1991)Google Scholar