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Dielectric Properties of Layer Polymer Films

Published online by Cambridge University Press:  15 February 2011

W. Sakai ,
T. Yoshiji ,
N. Tsutsumi  and
C. K. Chiang
W. Sakai
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, JAPAN
T. Yoshiji
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, JAPAN
N. Tsutsumi
Affiliation:
Department of Polymer Science and Engineering, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, JAPAN
C. K. Chiang
Affiliation:
Polymers Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8541, U.S.A.
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Abstract

The dielectric and thermal properties of three-layer structured films were studied. The two outer layers were about 1 μm and the thickness of the middle layer was varied. We measured the thickness dependence of the dielectric constant of the three-layer structured films. The dielectric results were evaluated with a simple serial three-capacitance model. Local thermal property of these polymer films were also measured using a micro-tip local thermal analysis method. Local glass transition of the film was compared with the one expected from bulk data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 769: Symposium H – Flexible Electronics - Materials and Device Technology , 2003 , H10.8
Copyright
Copyright © Materials Research Society 2003

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