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Dielectric Measurements On Printed-Wiring And Circuit Boards, Thin Films, And Substrates: An Overview1

Published online by Cambridge University Press:  15 February 2011

James Baker-Jarvis  and
Chriss A. Jones
James Baker-Jarvis
Affiliation:
Electromagnetic Fields Division, National Institute of Standards and Technology, MS 813.08, Boulder, CO 80303–3328
Chriss A. Jones
Affiliation:
Electromagnetic Fields Division, National Institute of Standards and Technology, MS 813.08, Boulder, CO 80303–3328
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Abstract

A review of the most common methods of permittivity measurements on thin films, printed-wiring and circuit boards, and substrates is presented. Transmission-line techniques, coaxial apertures, open resonators, surface-wave modes, and dielectric resonators methods are examined. The frequency range of applicability and typical uncertainties associated with the methods are summarized.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 381: Symposium F – Low-Dielectric Constant Materials--Synthesis and Applications in Micro. , 1995 , 153
Copyright
Copyright © Materials Research Society 1995

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Footnotes

1

U.S. Government work not protected by U.S. copyright

References

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