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Development of organic resistive memory for flexible electronics

Published online by Cambridge University Press:  12 June 2012

Nathalie Frolet ,
Micaël Charbonneau ,
Raluca Tiron ,
Julien Buckley ,
Denis Mariolle ,
Delphine Boutry ,
Romain Coppard  and
Barbara De Salvo
Nathalie Frolet
Affiliation:
CEA-LITEN LCEI 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Micaël Charbonneau
Affiliation:
CEA-LETI, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Raluca Tiron
Affiliation:
CEA-LETI, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Julien Buckley
Affiliation:
CEA-LETI, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Denis Mariolle
Affiliation:
CEA-LETI, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Delphine Boutry
Affiliation:
CEA-LITEN LCEI 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Romain Coppard
Affiliation:
CEA-LITEN LCEI 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
Barbara De Salvo
Affiliation:
CEA-LETI, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France
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Abstract

In this paper, we have performed further investigations and deepened our understanding of Polymer Resistive Random Access Memory devices (PoRRAM) on silicon substrate. Organic thin films based on blend of fullerene (C60) molecules and poly-methyl-methacrylate resist (PMMA) were analyzed from a material and electrical point of views. We have enlightened first the necessity of thermal treatment on the nano-composite layer in order to obtain memory effect in the device. Indeed from I-V measurements, only devices that had a thermal activation exhibited the hysteresis phenomenon, characteristic of the memory effect. The impact of thermal annealing has been investigated by morphological analysis (AFM and confocal microscopy) before and after thermal treatment. This process step induced the C60 molecules aggregation in the polymer matrix. The morphological study of these aggregates coupled with electrical measurements allowed us to determine the influence of aggregation on the electrical behavior. Due to their flexibility, this organic memories based on PMMA:C60 nanocomposites show a strong potential for an adaptation on plastic substrate.

Keywords

annealingmemorypolymer
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1430: Symposium E – Materials and Physics of Emerging Nonvolatile Memories , 2012 , mrss12-1430-e05-06
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Ling, Q-D., Liaw, D-J., Zhu, C., Chan, D. S-H., Kang, E-T. and Neoh, K-G., Progress in Polymer Science 33, 917 (2008).Google Scholar
2. Kim, T-W., Choi, H., Oh, S-H., Wang, G., Hwang, H. and Lee, T., Advanced Materials 21, 2497 (2009)Google Scholar
3. Son, D-I., You, C-H., Kim, W-T., Jung, J-H. and Kim, T-W., Applied Physics Letters 94, 132103 (2009)Google Scholar
4. Kim, H-J., jung, J-H., Ham, J-H. and Kim, T-W., Japanese Journal of Applied Physics 47, 5083 (2008)Google Scholar
5. Majumdar, H-S., Baral, J-K., Osterbacka, R., Ikkala, O. and Stubb, H., Organic electronics 6, 188 (2005)Google Scholar
6. Ling, Q-D., lim, S-L., Song, Y., Zhu, C-X., Chan, D., Kang, E-T. and Neoh, K-G., Langmuir 23, 312 (2007)Google Scholar
7. Baral, J.K., Majumdar, H.S., Laiho, A., Jiang, H., Kauppinen, E.I., Ras, R.H.A., Ruokolainen, J., Ikkala, O. and Osterbacka, R., Nanotechnology 19, 035203 (2008)Google Scholar
8. Lee, M.H., Jung, J.H., Shim, J.H. and Kim, T.W., Organic Electronics 12, 1341 (2011)Google Scholar
9. Charbonneau, M., Tiron, R., Buckley, J., Py, M., Barnes, J-P., Derrough, S., Constancias, C., Licitra, C., Sourd, C., Ghibaudo, G., De Salvo, B., 219th ECS Meeting Abstract 1309 (2010).Google Scholar
10. Py, M., Barnes, J-P., Charbonneau, M., Tiron, R. and Buckley, J., Surface and Interface Analysis 43(1–2), 179 (2010)Google Scholar
11. Laiho, A., Majumdar, H.S., baral, J.K., Jansson, F., Osterbacka, R. and Ikkala, O., Applied physics letters 93, 20309 (2008)Google Scholar
12. MacDonald, W.A., Journal materials chemistry 14, 4 (2004)Google Scholar