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Determining the Efficiency of Fast Ultrahigh-density Writing of Low-Conductivity Patterns on Semiconducting Polymers

Published online by Cambridge University Press:  10 February 2015

Panagiotis E. Keivanidis ,
Andrea di Donato ,
Davide Mencarelli ,
Alessandro Esposito ,
Tengling Ye ,
Guglielmo Lanzani ,
Giuseppe Venanzoni ,
Tiziana Pietrangelo ,
Antonio Morini  and
Marco Farina
Panagiotis E. Keivanidis*
Affiliation:
Cyprus University of Technology, Department of Mechanical Engineering and Materials Science and Engineering, Limassol, Cyprus
Andrea di Donato
Affiliation:
Department of Information Engineering, Universita` Politecnica delle Marche, Ancona, Italy.
Davide Mencarelli
Affiliation:
Department of Information Engineering, Universita` Politecnica delle Marche, Ancona, Italy.
Alessandro Esposito
Affiliation:
Department of Information Engineering, Universita` Politecnica delle Marche, Ancona, Italy.
Tengling Ye
Affiliation:
CNST of IIT@POLIMI, Milano, Italy
Guglielmo Lanzani
Affiliation:
CNST of IIT@POLIMI, Milano, Italy
Giuseppe Venanzoni
Affiliation:
Department of Information Engineering, Universita` Politecnica delle Marche, Ancona, Italy.
Tiziana Pietrangelo
Affiliation:
Department of Neuroscience and Imaging, Universita` ‘G. d’Annunzio’, Chieti, Italy.
Antonio Morini
Affiliation:
Department of Information Engineering, Universita` Politecnica delle Marche, Ancona, Italy.
Marco Farina
Affiliation:
Department of Information Engineering, Universita` Politecnica delle Marche, Ancona, Italy.
*
*Email: [email protected]
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Abstract

We present a nano-patterning process for semiconducting polymeric composites that could potentially be utilized for the development of polymer-based data storage devices. Nano-patterning (writing) operates on the basis of the mechanical interaction between the electrically unbiased tip of an atomic force microscope and the surface of polymeric composite films. Via friction forces, the tip/sample interaction produces a local increase of molecular disorder in the polymer matrix, inducing a localized lowering in the conductivity of the organic semiconductor. Herein we suggest a figure of merit for quantifying the efficiency of pattern formation and we address the dependence of the writing process on the thermal annealing temperature of the composite film. Control experiments on composite films deposited on substrates with different roughness suggest that the writing effect is invariant to the roughness of the substrate. The potential storage density of the writing process depends on the tip curvature.

Keywords

macromolecular structuremicrostructurestorage
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1729: Symposium M – Materials and Technology for Nonvolatile Memories , 2015 , pp. 125 - 130
Copyright
Copyright © Materials Research Society 2015 

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References

REFERENCES

Heremans, P., Gelinck, G. H., Müller, R., Baeg, K.-J., Kim, D.-Y., Noh, Y.-Y., Chem. Mater. 23, 341–358 (2011).CrossRefGoogle Scholar
Vettiger, P., Cross, G., Despont, M., Drechsler, U., Dürig, U., Gotsmann, B., Häberle, W., Lantz, M. A., Rothuizen, H. E., Stutz, R., and Binnig, G. K., IEEE Transactions on Nanotechnology, Vol. 1, No. 1, (2002)CrossRefGoogle Scholar
Farina, M., Ye, T., Lanzani, G., di Donato, A., Venanzoni, G., Mencarelli, D., Pietrangelo, T., Morini, A., Keivanidis, P. E., Nat. Comm. 4, 2668 (2013).CrossRefGoogle Scholar
Dang, X.-D., Dante, M., and Nguyen, T.-Q., Appl. Phys. Lett. 93, 241911 (2008)CrossRefGoogle Scholar
Lyuksyutov, S. F., Vaia, R. A., Paramonov, P. B., Juhl, S., Waterhouse, L., Ralich, R. M., Sigalov, G., Sancaktar, E., Nature Materials 2, 468–472 (2003).CrossRefGoogle Scholar
Nie, Z., Kumacheva, E., Nature Materials 7, 277–290 (2008).CrossRefGoogle Scholar
Zaniewski, A. M., Loster, M. and Zettl, A., Appl. Phys. Lett. 95, 103308 (2009).CrossRefGoogle Scholar
Adams, D., Belov, N., Chou, T-K., Heck, J., Kim, B., Knight, G., Ma, Q., Rao, V., Tchelepi, G., Nanotech, Vol. 1, ISBN: 978-1-4398-1782-7, (2009)Google Scholar
Wright, C. D., Shah, P., Wang, L., Aziz, M. M., Sebastian, A., Pozidis, H., Appl. Phys. Lett. 97, 173104 (2010).CrossRefGoogle Scholar