Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-19T22:57:47.602Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of the Energy Gap in Photoconducting Insulators Through Current Noise Measuremen

Published online by Cambridge University Press:  21 February 2011

A. Carbone ,
F. Demichelis  and
P. Mazzetti
A. Carbone
Affiliation:
Dipartimento di Fisica del Politecnico di Torino, Italy
F. Demichelis
Affiliation:
Dipartimento di Fisica del Politecnico di Torino, Italy
P. Mazzetti
Affiliation:
Dipartimento di Fisica del Politecnico di Torino, Italy
Get access

Abstract

Measurements of the current noise power spectrum of the photoconducting insulators CdS and CdSe irradiated with monochromatic light of different wavelength A are reported.

It is shown that there is an abrupt change of about one order of magnitude in the low frequency power density of the noise when A crosses the photoconductor gap value Ag and the photocurrent and the device conductance are kept constant by varying the light intensity.

The effect is explained in terms of an abrupt increase of the carrier recombination rate when the photon energy becomes larger than the energy gap of the photoconductor. Possible applications of these results are briefly discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 152: Symposium H – Optical Materials: Processing and Science , 1989 , 163
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Shulman, C., Smith, R., Rose, A. - Phys. Rev. 92, 857 A (1953)Google Scholar
2) Shulman, C. - Phys. Rev. 48, 384 (1955)Google Scholar
3) Van Vliet, K.M., Blok, J., Physica 22, 231, (1956)Google Scholar
4) Van Vliet, K.M., Blok, J., Ris, C. and Steketee, J. - Physica 22, 723, (1956)CrossRefGoogle Scholar
5) Kruizinga, S. and Zijlstra, R.J.J. - Phys. Letters 28 A, 399, (1968)Google Scholar
6) Zijlstra, R.I.J. - Conference on Physical Aspect of Noise in Electronic Devices-University of Nottingham -11–13 sept. 1968 p. 184 (1968)Google Scholar
7) Van Vliet, K.M. - Physica 83, 52, (1976)Google Scholar
8) Smith, D.L. - J. Appl. Phys. 53, 7051, (1982)Google Scholar