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Determination of Ag/Co Interfacial Free Energies by Biaxial Zero Creep Experiments

Published online by Cambridge University Press:  10 February 2011

Bing An ,
Tong-jun Zhang ,
Chao Yuan ,
Kun Cui  and
Wei Zhang
Bing An
Affiliation:
State Key Laboratory of Die and Mould Technology, Huazhong University of Science and Technology, Wuhan, 430074, China
Tong-jun Zhang*
Affiliation:
State Key Laboratory of Die and Mould Technology, Huazhong University of Science and Technology, Wuhan, 430074, China
Chao Yuan
Affiliation:
State Key Laboratory of Die and Mould Technology, Huazhong University of Science and Technology, Wuhan, 430074, China
Kun Cui
Affiliation:
State Key Laboratory of Die and Mould Technology, Huazhong University of Science and Technology, Wuhan, 430074, China
Wei Zhang
Affiliation:
University of Maryland, Gaithersburg, MD, USA
*
1Corresponding author. Tel.: +86-27-87540944; Fax: +86-27-87543776. E-mail address: [email protected] (T. J. Zhang)
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Abstract

To measure the Ag/Co interfacial free energies, biaxial zero creep experiments were performed on Ag/Co multilayer films deposited on the Si (111) wafers. As the samples were heated from room temperature to 450°C, the residual stress in films, which was in situ monitored by substrate curvature technique, decayed gradually to zero due to the increasing plastic deformation in films. After held for several hours at 450°C, they reached a zero creep state while the equilibrium stresses were measured. The annealed element layers were immiscible, and exhibited the column grain distribution and (111) preferred orientations. Based on the Josell model, the free energy of Ag/Co (111) interfaces at 450°C was found to be 1.02 ± 0.17 J/m2.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 778: Symposium U – Mechanical Properties Derived from Nanostructuring Materials , 2003 , U6.15
Copyright
Copyright © Materials Research Society 2002

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