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Design for Reliability and Common Failure Mechanisms in Vertical Cavity Surface Emitting Lasers

Published online by Cambridge University Press:  17 May 2012

Robert W. Herrick
Robert W. Herrick*
Affiliation:
JDSU Inc, 80 Rose Orchard Way, San Jose, CA 95134, U.S.A.
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Abstract

Vertical-Cavity Surface-Emitting Lasers are making up a large and growing share of the world’s production of semiconductor lasers. But the 850 nm GaAs quantum well VCSELs that make up most of present product are highly vulnerable to dislocation networks. In this paper, we discuss how materials selection affects the reliability of semiconductor lasers generally. We then describe the most common failure mechanisms observed in VCSELs, and what precautions are used to prevent them. We finish with a brief discussion of reliability testing and failure analysis.

Keywords

laserdefectselectronic material
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1432: Symposium G – “Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II” , 2012 , mrss12-1432-g01-04
Copyright
Copyright © Materials Research Society 2012

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References

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