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Depth-Profiling of Near-Surface Atomic Correlations by Total Reflection of Synchrotron Radiation

Published online by Cambridge University Press:  25 February 2011

H. Dosch ,
D. C. Wack  and
B. W. Batterman
H. Dosch
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
D. C. Wack
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
B. W. Batterman
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
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Abstract

We report measurement of Bragg intensities obtained from an Fe3Al(110) single crystal under the condition of total reflection. It is demonstrated that depth-resolved near-surface atomic correlations can be achieved by the independent control of both ocurring grazing angles.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 69: Symposium D – Materials Characterization , 1986 , 209
Copyright
Copyright © Materials Research Society 1986

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References

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