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Depth Profiling of Hydrogen in Ion-Implanted Polymers

Published online by Cambridge University Press:  25 February 2011

J. David Carlson ,
Peter P. Pronko  and
David C. Ingram
J. David Carlson
Affiliation:
Lord Corporation Research Center, P.O. Box 1107, Cary, NC 27511, USA
Peter P. Pronko
Affiliation:
Universal Energy Systems, 4401 Dayton-Xenia Road, Dayton, OH 45432, USA
David C. Ingram
Affiliation:
Universal Energy Systems, 4401 Dayton-Xenia Road, Dayton, OH 45432, USA
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Abstract

Depth profiling of hydrogen in polymeric materials poses special problems. Backscattering methods are ruled out because of kinematics. Nuclear reaction methods are undesirable because small reaction cross sections necessitate large fluences of high mass projectiles and result in unacceptable levels of radiation damage. We have used a helium-induced proton-recoil technique with 3 MeV 4He particles to measure the hydrogen distribution in pristine and ion-implanted polyvinylidene fluoride (PVDF) films. The incident 4He particles stopped in the 25 micron PVDF films while the recoiling protons were detected after passing through the polymer film. Large changes in the hydrogen content of PVDF films implanted with modest fluences of 6 MeV carbon, oxygen and nickel ions were observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 27: Symposium E – Ion Implantation and Ion Beam Processing of Materials , 1983 , 455
Copyright
Copyright © Materials Research Society 1984

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References

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