No CrossRef data available.
Article contents
Deformation-induced Transformations of Nanocrystalline Ge-Si Film During Indentation
Published online by Cambridge University Press: 01 February 2011
Abstract
Thin films of Ge-Si with a duplex nanocrystalline structure were fabricated by magnetron co-sputtering and nanoindentations were made on these films. Transmission electron microscopy and Raman spectroscopy were used to analyze the deformed microstructures in the residual indentations. Amorphization and diamond-cubic (dc) to non-diamond-cubic (non-dc) phase transformation were observed and considered as the major micromechanisms in the deformation of the Ge-Si duplex nanocrystals.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2006