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Deformation of Small Volumes of Material Studied Using Strained-Layer Superlattice Structures

Published online by Cambridge University Press:  10 February 2011

K.M.Y. P'ng ,
A.J. Bushby  and
D.J. Dunstan
K.M.Y. P'ng
Affiliation:
Department of Materials, Queen Mary, University of London, E1 4NS, UK.
A.J. Bushby
Affiliation:
Department of Materials, Queen Mary, University of London, E1 4NS, UK.
D.J. Dunstan
Affiliation:
Department of Physics, Queen Mary, University of London, E1 4NS, UK.
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Abstract

Mechanical studies of semiconductor superlattices have shown that the onset of plastic deformation under an inhomogeneous stress is a process that takes place simultaneously across a finite volume of the order of a micron across. The ability to incorporate known internal stresses, and to vary the stress and thickness of individual layers in a semiconductor superlattice, is a very powerful tool, opening up new possibilities for investigations that cannot be achieved by varying external stresses on a specimen that is sensibly homogeneous. In this way, from the initial yield stress of single-crystal strained-layer superlattices under indentation, we demonstrated a new criterion, of which the key feature is that it is to be averaged over a finite volume. Here we show that designing samples with individual layers in bands to form low yield-stress material within the structure can give information about the size and position of the initial yield volume.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 778: Symposium U – Mechanical Properties Derived from Nanostructuring Materials , 2003 , U6.3
Copyright
Copyright © Materials Research Society 2002

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References

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