Published online by Cambridge University Press: 11 February 2011
The combination of bright-field and weak-beam transmission electron microscopy (TEM) techniques has been used to analyse the dislocation systems activated in LaNi5 and derivatives after absorption/desorption hydrogen cycling.
The TEM results are discussed and compared with those obtained from the modelling of the anisotropic diffraction peak broadening using only two dislocation slip systems of the hexagonal structure (1).