Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-29T06:15:52.851Z Has data issue: false hasContentIssue false
  • English
  • Français

Defect Healing of Carbon Nanotubes by Rapid Vacuum Arc Annealing

Published online by Cambridge University Press:  01 February 2011

Jeff Tsung-Hui Tsai ,
Jason Li  and
Andy Tseng
Jeff Tsung-Hui Tsai
Affiliation:
[email protected], Tatung University, Graduate Institute of Electro-Optical Engineering, No.40, Sec. 3, Jhongshan N. Rd., Taipei, N/A, Taiwan, +886 25925252 ext 2970
Jason Li
Affiliation:
[email protected], Tatung University, Graduate Institute of Electro-Optical Engineering, No.40, Sec. 3, Jhongshan N. Rd., Taipei, 10452, Taiwan
Andy Tseng
Affiliation:
[email protected], Tatung University, Graduate Institute of Electro-Optical Engineering, No.40, Sec. 3, Jhongshan N. Rd., Taipei, 10452, Taiwan
Get access

Abstract

A rapid thermal annealing process is demonstrated for healing the defects in carbon nanotubes using a DC vacuum arc discharge system. Multi-walled carbon nanotubes (MWCNTs) grown by chemical vapor deposition at a relatively low temperature (∼650 °C) showed structural imperfections inside the tubes which are known as "bamboo-like" defects. These defects can be thermally annealed to reconstruct the graphitic structure. A vacuum arc discharge system was used to generate high temperatures (∼1800 °C) followed by rapid cooling. The MWCNTs can be rapidly annealed in such a system by several heating and cooling cycles. The annealed samples were characterized by Raman spectroscopy and transmission electron microscopy. The defects were found to be healed when the environment contained water vapor, indicating that oxygen may play an important role in breaking the imperfect graphitic structure and removing the weakly bonded defects during the rapid heating cycles. After breaking the “bamboo” segment, the graphene shell was then reconstructed during the cooling process to produce multi-shell perfection. This method produces effective defect healing and bamboo structure removal from MWCNTs.

Keywords

annealingnanostructureelectronic material
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1057: Symposium II – Nanotubes and Related Nanostructures , 2007 , 1057-II10-31
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Munoz-Navia, M., Dorantes-Davila, J., Terrones, M., Hayashi, T., Kim, Y. A., Endo, M., Dresselhaus, M.S., and Terrones, H. Chem. Phys. Lett., 407, 327 (2005).Google Scholar
2. Kim, Y. A., Muramatsu, H., Hayashi, T., Endo, M., Terrones, M., and Dresselhaus, M. S. Chem. Phys. Lett., 398, 87 (2004).Google Scholar
3. Yudasaka, M., Ichihashi, T., Kasuya, D., Kataura, H., and Iijima, S. Carbon, 41, 1273 (2003).Google Scholar
4. Zhong, R., Cong, H., and Liu, C. Carbon, 40, 2970 (2002).Google Scholar
5. Gutiérrez, H. R., Kim, U. J., Kim, J. P., and Eklund, P. C. Nano Lett., 5, 2195 (2005).Google Scholar
6. Andrews, R., Jacques, D., Qian, D. and Dickey, E. C. Carbon, 39, 1681 (2001).Google Scholar
7. Tans, S. J., Verschueren, A. R. M., and Dekker, C. Nature, 393, 49 (1998).Google Scholar
8. Bachtold, A., Hadley, P., Nakanishi, T., and Dekker, C. Science, 294, 1317 (2001).Google Scholar
9. Naeemi, A., Sarvari, R., and Meindl, J. D. IEEE Elect. Dev. Lett., 26, 84 (2005).Google Scholar
10. Ahmad, K., Pan, W., and Shi, S. L. Appl. Phys. Lett., 89, 133122 (2006).Google Scholar
11. Dai, H. J., Wong, E.W., and Lieber, C. M. Science,272, 523 (1996).Google Scholar
12. Wang, Y., Wu, J., and Wei, F. Carbon, 41, 2939 (2003).Google Scholar
13. Chen, C. C., Chen, C. F., Chen, C. M., and Chuang, F. T. Electrochemistry Communications, 9, 159 (2007).Google Scholar
14. Tsai, J. T. H., and Chen, K. H. International Journal of Nanoscience, 4, 431 (2005).Google Scholar
15. Zhang, X. X., Li, Z. Q., Wen, G. H., Fung, K. K., Chen, J., and Li, Y. Chem. Phys. Lett., 333, 509 (2001).Google Scholar
16. Ewels, C. P., and Glerup, M. J. Nanoscience and Nanotechnology, 5, 1345 (2005).Google Scholar
17. Li, J. L., Kudin, K. N., McAllister, M. J., Prud'homme, R. K., Aksay, I. A., and Car, R. Phys. Rev. Lett., 96, 176101 (2006).Google Scholar