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Defect Generation by Proton Irradiation of Semi-Insulating Lec GaAs

Published online by Cambridge University Press:  15 February 2011

A. Castaldin
Affiliation:
INFM ETSII, 47011 Valladolid, Spain Dip. Fisica, Universita di Bologna, 40126 Bologna, Italy
A. Cavallini
Affiliation:
INFM ETSII, 47011 Valladolid, Spain Dip. Fisica, Universita di Bologna, 40126 Bologna, Italy
L. Polenta
Affiliation:
INFM ETSII, 47011 Valladolid, Spain Dip. Fisica, Universita di Bologna, 40126 Bologna, Italy
C. Canali
Affiliation:
INFM ETSII, 47011 Valladolid, Spain Dip. Elettronica, University of Modena, Modena, Italy
F. Nava
Affiliation:
Dip. Fisica, University of Modena, Modena, Italy
E. De La Puentee
Affiliation:
Fisica de la Materia Condensada, ETSII, 47011 Valladolid, Spain, [email protected]
A. Alvarez
Affiliation:
Fisica de la Materia Condensada, ETSII, 47011 Valladolid, Spain, [email protected]
J. Jimenez
Affiliation:
Fisica de la Materia Condensada, ETSII, 47011 Valladolid, Spain, [email protected]
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Abstract

High energy and high fluence proton irradiated semi-insulating GaAs has been studied by EBIC, PL mapping, C-V, NTSC, PICTS and p-DLTS. The main defects generated by the irradiation were analyzed. An EL2-like defect was found to be dominant. The generation of this defect annihilates the typical cellular distribution of EL2 in as-grown material. The generated EL2 defects present a different photoquenching behavior than the as-grown EL2 defects.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

1. Lai, S.T., Alexiev, D. and Nener, B.D.; 1995 J.Appl. Phys. 78, 3686.Google Scholar
2. Aliyu, Y H, Morgan, D V and Bunce, R W; 1993 Phys. Stat. Sol. (a) 135, 119.Google Scholar
3. Pons, D and Bourgoin, J C; 1985 J. Phys. C 18, 3839.Google Scholar
4. Martin, G.M. and Makram-Ebeid, S.; in Deep Centers in Semiconductors, ed. by Pantelides, S.T. (Gordon and Breach Science publishers 1986), p. 399.Google Scholar
5. Alietti, M, Canali, C, Castaldini, A, Cavallini, A, Cetronio, A, Chiossi, C, , D'Auria, Del Papa, C, Lanzieri, C, Nava, F and Vanni, P, 1995 Nucl. Instr. & Meth. Phys. Res. B90, 344.Google Scholar
6. Look, D.C.; in Electrical characterization of GaAs materials and devices (John Wiley & Sons, Chichester 1989).Google Scholar
7. Mooney, P J; 1983 J. Appl. Phys. 54, 208.Google Scholar
8. Look, D C, Fang, Z-Q, Hemsky, J W and Kengkan, P; 1997 Phys. Rev. B 55, 2214.Google Scholar
9. Kuriyama, K, Takahashi, H, Kawahara, H, Hayashi, N, Watanabe, H, Sakamoto, I and Kohno, I; 1990 J. Appl. Phys. 68, 6517.Google Scholar
10. Kuriyama, K, Kawahara, H, Satoh, M and Kawakubo, T; 1988 Appl. Phys. Lett. 53, 1074.Google Scholar
11. Jimenez, J, Alvarez, A, Chafai, M and Bonnafe, J; 1994 Phys.Rev. B 50, 14122.Google Scholar
12. Alvarez, A, Jimenez, J, Gonzalez, M A and Sanz, L F; 1997 Appl. Phys. Lett 70, 3131.Google Scholar
13. Suemitsu, M, Takahashi, H and Miyamoto, N; 1995 Phys.Rev.B 52, 1666.Google Scholar