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Defect Engineered Multi-Walled Carbon Nanotube arrays as Electrochemical Double Layer Capacitors

Published online by Cambridge University Press:  13 May 2013

Rajaram Narayanan
Affiliation:
Department of Nanoengineering, University of California, San Diego, La Jolla, CA 92037-15, U.S.A.
Mark Hoefer
Affiliation:
Department of Mechanical and Aerospace Engineering, University of California, San Diego, La Jolla, CA 92037-15, U.S.A.
Prabhakar R. Bandaru
Affiliation:
Department of Nanoengineering, University of California, San Diego, La Jolla, CA 92037-15, U.S.A. Department of Mechanical and Aerospace Engineering, University of California, San Diego, La Jolla, CA 92037-15, U.S.A.
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Abstract

The efficacy of vertically aligned defect engineered multi-walled carbon nanotube (MWCNT) arrays as electrochemical double layer capacitors (EDLCs) was investigated using standard electrochemical techniques such as cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS). We report a ∼ 200% improvement in specific double layer capacitance of MWCNT arrays by extrinsically introducing defects using argon plasma irradiation. The capacitance-voltage characteristics of argon irradiated MWCNTs provide insights into the nature of the defects and their influence on the specific capacitance (capacitance/area).

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

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References

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