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Current Images of CdSe Colloidal Nanodots Observed by Conductive-tip Atomic Force Microscopy

Published online by Cambridge University Press:  21 March 2011

Ichiro Tanaka ,
Eri Kawasaki ,
O. Ohtsuki ,
M. Hara ,
H. Asami  and
I. Kamiya
Ichiro Tanaka
Affiliation:
Department of Materials Science & Chemistry, Wakayama University.
Eri Kawasaki
Affiliation:
Department of Materials Science & Chemistry, Wakayama University.
O. Ohtsuki
Affiliation:
Department of Materials Science & Chemistry, Wakayama University.
M. Hara
Affiliation:
Frontier Research System, RIKEN, 2-1 Hirosawa Wako, Saitama 351-0198, Japan
H. Asami
Affiliation:
Science and Technology Research Center, Mitsubishi Chemical Corp., 1000 Kamoshida-cho, Aoba-ku, Yokohama 227-8502, Japan
I. Kamiya
Affiliation:
Science and Technology Research Center, Mitsubishi Chemical Corp., 1000 Kamoshida-cho, Aoba-ku, Yokohama 227-8502, Japan
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Abstract

We have fabricated submonolayer-thick films of CdSe colloidal nanodots in order to investigate electronic properties of individual nanodots by conductive-tip atomic force microscopy (AFM). Topographic and current images of isolated single CdSe colloidal dots on single crystalline Au (111) surface which was covered with dodecanethiol self-assembled monolayer were obtained by AFM operating in contact mode with a conductive tip under appropriate bias voltages. In the current image, it is found that the dot regions have higher electric resistances due to tunneling resistance through the CdSe dots. We also found 10 nm-scale electric inhomogeneity around the dots, which may corresponds to the previously reported etch-pits of Au (111) surfaces formed during the deposition of the dodecanethiol molecules.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 692: Symposium H – Progress in Semiconductor Materials for Optoelectronic Applications , 2001 , H9.19.1
Copyright
Copyright © Materials Research Society 2002

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