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Crystal Lattice Controlled SiGe Thermoelectric Materials with High Figure of Merit

Published online by Cambridge University Press:  14 March 2011

Hyun Jung Kim ,
Yeonjoon Park ,
Glen C. King ,
Kunik Lee  and
Sang H. Choi
Hyun Jung Kim
Affiliation:
National Institute of Aerospace (NIA), Hampton, VA 23666, U.S.A.
Yeonjoon Park
Affiliation:
National Institute of Aerospace (NIA), Hampton, VA 23666, U.S.A.
Glen C. King
Affiliation:
NASA Langley Research Center, Hampton, VA 23669, U.S.A.
Kunik Lee
Affiliation:
Federal Highway Administration of Department of Transportation, McLean, VA 22101, USA
Sang H. Choi
Affiliation:
NASA Langley Research Center, Hampton, VA 23669, U.S.A.
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Abstract

Direct energy conversion between thermal and electrical energy, based on thermoelectric (TE) effect, has the potential to recover waste heat and convert it to provide clean electric power. The energy conversion efficiency is related to the thermoelectric figure of merit ZT expressed as ZT=S2σT/κ, T is temperature, S is the Seebeck coefficient, σ is conductance and κ is thermal conductivity. For a lower thermal conductivity κ and high power factor (S2σ), our current strategy is the development of rhombohedrally strained single crystalline SiGe materials that are highly [111]-oriented twinned. The development of a SiGe “twin lattice structure (TLS)” plays a key role in phonon scattering. The TLS increases the electrical conductivity and decreases thermal conductivity due to phonon scattering at stacking faults generated from the 60° rotated primary twin structure. To develop high performance materials, the substrate temperature, chamber working pressure, and DC sputtering power are controlled for the aligned growth production of SiGe layer and TLS on a c-plane sapphire. Additionally, a new elevated temperature thermoelectric characterization system, that measures the thermal diffusivity and Seebeck effect nondestructively, was developed. The material properties were characterized at various temperatures and optimized process conditions were experimentally determined. The present paper encompasses the technical discussions toward the development of thermoelectric materials and the measurement techniques.

Keywords

thermoelectriccrystal growthx-ray diffraction (XRD)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1314: Symposium LL – Thermoelectric Materials for Solid-State Power Generation and Refrigeration , 2011 , mrsf10-1314-ll05-17
Copyright
Copyright © Materials Research Society 2011

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