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Cross-Sectioning Magnetic Thin Films for Tem

Published online by Cambridge University Press:  21 February 2011

H.-M. Ho ,
G. Thomas ,
C. N. Schooley  and
J.-S. Gau
H.-M. Ho
Affiliation:
Department of Materials Science & Mineral Engineering and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
G. Thomas
Affiliation:
Department of Materials Science & Mineral Engineering and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
C. N. Schooley
Affiliation:
Electron Microscope Lab., U. C. Berkeley, CA 94720
J.-S. Gau
Affiliation:
Control Data Company, Minneapolis, MN 55435
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Abstract

Oblique incidence magnetic thin films are considered to be the most appropriate recording media for the next generation of video tape applications. In order to study the microstructure of such thin films, a specimen preparation technique employing ultramicrotomy has been developed. Because oblique incidence thin films have a porous structure and poor adhesion to the substrate, the problem of splitting of the thin films from the substrate is severe. This problem is reduced considerably by the following exercises: 1. using an acrylic embedding resin e.g. LR White (London Resin Co.), 2. thorough degreasing with solvents, 3. using a 55° diamond knife, and 4. trimming the block with a microtome before actual sectioning. The details of this preparation technique and some results obtained with this technique are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 149
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Ozawa, K., Masuya, H., and Takahashi, M., Journal of Magnetism and Magnetic Materials, 40, 175 (1983).Google Scholar
2. Thomas, G., Transmission Electron Microscopy of Metals, (John Wiley & Sons, New York, 1962), p. 182.Google Scholar
3. Csencsits, R., Schooley, C., and Gronsky, R., Journal of Electron Microscopy Technique, 2, 643 (1985).Google Scholar
4. Murphy, J. A. and Price, R. L., in Proceedings of the 41st Annual Meeting of the Electron Microscopy Society of America. edited by G. W. Bailey, (San Francisco Press, San Francisco, 1983), p. 624.Google Scholar