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Published online by Cambridge University Press: 28 February 2011
Auger electron spectroscopy (AES) and core‐level x‐ray photoelectron spectroscopy (XPS) have been used to study the compositional and electronic‐state variations from the contaminated surface layer to the inner region of YBa2Cu3Ox and Bi2(Sr,Ca)n+1Cun02n+4 compounds. The results showed that the carbon‐rich contamination layer in BSCCO is thin and easier to be removed by Ar+ sputtering, indicating a much more stable surface than that of YBCO. This layer is oxygen deficient and contains higher Cu2+ satellites ( 2p3d9 final states) than in the bulk materials. Line‐shape analysis suggests three‐Gaussian features for both Cu 2p3/2 and O Is lines. The 529 eV signal is observed in both YBCO and BSCCO O Is spectra.