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Correlations Between Electrical Properties and Solid-State Reactions in Co/N-GaAs Contacts: A Bulk and Thin-Film Study

Published online by Cambridge University Press:  25 February 2011

F.-Y. Shiau  and
Y. A. Chang
F.-Y. Shiau
Affiliation:
Department of Materials Science and EngineeringUniversity of Wisconsin-MadisonMadison, WI 53706
Y. A. Chang
Affiliation:
Department of Materials Science and EngineeringUniversity of Wisconsin-MadisonMadison, WI 53706
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Abstract

A fundamental and comprehensive approach has been taken to study Co//GaAs interfacial reactions, using phase diagram determination, bulk and thin-film diffusion couple studies, and electrical characterization. Phase formation sequences and interfacial morphologies are found to be similar in bulk and thin-film couples. Thermodynamic and kinetic analyses are used to rationalize the contact formations. The electrical properties of the contacts are correlated to the phase formation sequences and phase diagram information.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 148: Symposium D – Chemistry and Defects in Semiconductor Heterostructures , 1989 , 29
Copyright
Copyright © Materials Research Society 1989

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