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CoPt3 nanoparticles adsorbed on SiO2: a GISAXS and SEM study

Published online by Cambridge University Press:  01 February 2011

Jan I. Flege
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Thomas Schmidt
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Gabriela Alexe
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Torben Clausen
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
Sigrid Bernstorff
Affiliation:
Sincrotrone Trieste, Strada Statale 14, km 163.5, 34012 Basovizza / Trieste, Italy
Igor Randjelovic
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Vesna Aleksandrovic
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Andreas Kornowski
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Horst Weller
Affiliation:
Institute of Physical Chemistry, University of Hamburg, Grindelallee 117, 20146 Hamburg, Germany
Jens Falta
Affiliation:
Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany
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Abstract

Ultra-thin CoPt3 nanoparticle films have been prepared on SiO2 surfaces using a Langmuir-Blodgett (LB) deposition technique. The structural properties of the overlayers have been investigated by grazing-incidence small-angle x-ray scattering (GISAXS) and high-resolution scanning electron microscopy (SEM) for the first time. Self-assembly of the nanoparticles is found and with GISAXS an average particle-particle distance of (8.23 ± 0.06) nm is determined, in good agreement with the SEM results. A particle correlation length of (22.3 ± 1.2) nm was derived which is shown to be independent of the surface coverage. The latter quantity may be controlled by choice of a suitable retraction speed during the LB step.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

[1] Nanoparticles: From Theory to Application, edited by Schmid, G. (Wiley-VCH Verlag, Weinheim, 2004).Google Scholar
[2] Shevchenko, E. V., Talapin, D. V., Rogach, A. L., Kornowski, A., Haase, M., and Weller, H., J. Am. Chem. Soc. 124, 11480 (2003).Google Scholar
[3] Shevchenko, E. V., Talapin, D. V., Schnablegger, H., Kornowski, A., Festin, O., Svedlindh, P., Haase, M., and Weller, H., J. Am. Chem. Soc. 125, 9090 (2003).Google Scholar
[4] Aleksandrovic, V. et al., in prep.Google Scholar
[5] Achermann, M., Petruska, M. A., Crooker, S. A., and Klimov, V. I., J. Phys. Chem. B 107, 13782 (2003).Google Scholar
[6] Meldrum, F. C., Kotov, N. A., and Fendler, J. H., Langmuir 10, 2035 (1994).Google Scholar
[7] Amenitsch, H., Rappolt, M., Kriechbaum, M., Mio, H., Laggner, P., and Bernstorff, S., J. Synchrotron Rad. 5, 506 (1998).Google Scholar
[8] Huang, T., Toraya, H., Blanton, T., and Wu, Y., J. Appl. Cryst. 26, 180 (1993).Google Scholar
[9] Yoneda, Y., Phys. Rev. 131, 2010 (1963).Google Scholar
[10] Dietrich, S. and Haase, A., Phys. Rep. 260, 1 (1995).Google Scholar
[11] Rauscher, M., Paniago, R., Metzger, H., Kovats, Z., Domke, J., Pfannes, H. D., Schulze, J., and Eisele, I., J. Appl. Phys. 86, 6763 (1999).Google Scholar
[12] Lazarri, R., J. Appl. Cryst. 35, 406 (2002).Google Scholar
[13] Guinier, A., X-Ray Diffraction (Freeman, San Francisco, 1968).Google Scholar
[14] Glatter, G. and Kratky, O., Small-Angle X-ray Scattering (Academic Press, New York, 1982).Google Scholar