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Converting Films for X-Ray Detectors, Applied to Amorphous Silicon Arrays.

Published online by Cambridge University Press:  10 February 2011

S. Ross  and
G. Zentai
S. Ross
Affiliation:
Argonne National Laboratory, Argonne IL [email protected]
G. Zentai
Affiliation:
Currently with Optical Imaging Systems, Inc., Northville MI 48167.
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Abstract

This paper presents results from our on-going efforts to characterize semiconductor thin films for direct x-ray conversion. We deposit these thin films onto an amorphous silicon (a-Si:H) readout array with the overall goal of developing a large area x-ray detector for protein crystallography, and for other x-ray imaging fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 487: Symposium I – Semiconductors for Room-Temperature Radiation II , 1997 , 393
Copyright
Copyright © Materials Research Society 1998

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