Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-25T18:53:28.008Z Has data issue: false hasContentIssue false
  • English
  • Français

Control of Optical Performance from Er-Doped Alumina Synthesized Using An Ecr Plasma

Published online by Cambridge University Press:  10 February 2011

J. C. Barbour  and
B. G. Potter
J. C. Barbour
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-1056
B. G. Potter
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-1056
Get access

Abstract

Hydrogen in deposited optical ceramics can modify the optical properties, and therefore the role of the hydrogen needs to be understood to control its effects. Erbium-doped amorphous alumina films were deposited using simultaneous electron beam evaporation of aluminum and erbium while bombarding the sample with 30 eV 02+ ions from an electron cyclotron resonance (ECR) plasma. The hydrogen content was measured, using elastic recoil detection, as a function of isochronal annealing treatments. The data was fit to a simple trap-release model in order to determine an effective activation energy for the thermal release of H from alumina and Er-doped alumina. The intensity of the ion-beam stimulated luminescence from these samples was monitored in the visible and near infrared regions as a function of the thermal treatments. In order to gain a better understanding of the influence of hydrogen, the ionoluminescence (IL) data from samples containing hydrogen were fit with a simple linear equation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 504: Symposium KK – Atomistic Mechanisms in Beam Synthesis & Irradiation… , 1997 , 387
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Barbour, J.C., Potter, B.G., Follstaedt, D.M., Knapp, J.A., and Sinclair, M.B., in Materials Modification and Synthesis by Ion Beam Processing, edited by Alexander, D., Park, B., Cheung, N., and Skorupa, W. (Mater Res. Soc. Proc. 438, Pittsburgh, PA, 1997) p. 465.Google Scholar
[2] Barbour, J.C., Follstaedt, D.M., and Myers, S.M., Nucl. Instrum. Methods B 106, 84 (1995).Google Scholar
[3] Barbour, J.C., Apblett, C.A., Denison, D.R., and Sullivan, J.P., in Silicon Nitride and Silicon Dioxide Thin Insulating Films, edited by Deen, M.J., Brown, W.D., Sundaram, K.B., and Raider, S.I. (The Electrochem. Soc. Proc. 97–10, Pennington, NJ, 1997) p. 520.Google Scholar
[4] Crosswhite, H.M. and Moos, H.W., Optical Properties of Ions in Crystals, (Interscience Publishers, John Wiley & sons, New York, NY, 1967) 552 pp.Google Scholar
[5] Dieke, G. H., Spectra and Energy Levels of Rare Earth Ions in Crystals, (Interscience Publishers, John Wiley & sons, New York, NY, 1968) 401 pp.Google Scholar
[6] Morrison, C. A. and Leavitt, R. P., in Handbook of the Physics and Chemistry of Rare Earths, Vol. 5, edited by Gschneider, K. A. Jr and Eyring, L. (North-Holland Publishing Co., New York, NY, 1982) p. 461.Google Scholar