Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-29T08:49:46.926Z Has data issue: false hasContentIssue false

Control of Metal Film Properties by Ion Assisted Deposition

Published online by Cambridge University Press:  25 February 2011

Ronnen A. Roy
Affiliation:
IBM Research Division, Watson Research Center, P.O. Box 218, Yorktown Heights, N.Y., 10598
Dennis S. Yee
Affiliation:
IBM Research Division, Watson Research Center, P.O. Box 218, Yorktown Heights, N.Y., 10598
Jerome J. Cuomo
Affiliation:
IBM Research Division, Watson Research Center, P.O. Box 218, Yorktown Heights, N.Y., 10598
Get access

Abstract

Ion-assisted deposition allows for independent control of ion energy, ion flux, and adatom flux incident on the growing film. We describe herein general trends in property and structure modification of thin film metals using this technique.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Hoffman, D. W. and Thornton, J. A., J.Vac. Sci. Technol. 20 (3), 35(1982)Google Scholar
2. Hoffman, D.W. and Gaerttner, M. R., J. Vac. Sci. Technol. 17 (1), 425 (1980)CrossRefGoogle Scholar
3. Berg, R. S. and Kominiak, G. J., J. Vac. Sci. Technol. 13 (1), 403 (1976)CrossRefGoogle Scholar
4. Ziemann, P. and Kay, E., J. Vac. Sci. Technol. 21 (3), 828 (1982)CrossRefGoogle Scholar
5. Harper, J. M. E., Cuomo, J. J., Gambino, R. J., and Kaufman, H. R., in Ion Bombardment Modification of Surfaces: Fundamentals and Applications, Auciello, O. and Kelley, R., eds., Elsevier Science Publishers B. V., Amsterdam, 1984 Google Scholar
6. Cuomo, J. J., Harper, J. M. E., Guarnieri, C. R., Yee, D. S., Attanasio, L. J., Angilello, J., Wu, C. T., and Hammond, R. H., J. Vac. Sci. Technol., 20 (3), 349 (1982)CrossRefGoogle Scholar
7. Yee, D. S., Floro, J., Mikalsen, D. J., Cuomo, J. J., Ahn, K. Y., and Smith, D. A., J. Vac. Sci. Technol., A 3 (6), 2121 (1985)CrossRefGoogle Scholar
8. Roy, R. A., Cuomo, J. J., and Yee, D. S., J. Vac. Sci. Technol. A 6 3, 1621 (1988)CrossRefGoogle Scholar
9. Roy, R. A., Yee, D. S., and Cuomo, J. J., (to be published)Google Scholar
10. Roy, R.A., Petkie, R., Yee, D. S., Karasinski, J., Boulding, A., and Kelleher, K., these proceedingsGoogle Scholar
11. Thornton, J. A. and Hoffman, D. W., J. Vac. Sci. Technol. 18 (2), 203 (1981)CrossRefGoogle Scholar
12. Huang, T. C., Lim, G., Parmigiani, F., and Kay, E., J. Vac. Sci. Technol., A 3 (6), 2161 (1985)CrossRefGoogle Scholar
13. Hall, E. O., Proc. Phys. Soc. London B64 747 (1951)Google Scholar
14. Petch, N. J., J. Iron Steel Inst. 174, 25 (1953)Google Scholar
15. Parmigiani, F., Kay, E., Huang, T. C., Perrin, J., Jurich, M., and Swalen, J. D., Phys. Rev. B, 33 (2), 879 (1986)CrossRefGoogle Scholar
16. Winters, H. F. and Kay, E., J. Appl. Phys., 38 3928 (1967)CrossRefGoogle Scholar
17. Blachman, A. G., Met. Trans. 2, 699 (1971)CrossRefGoogle Scholar
18. Bland, R. D., Kominiak, G. J., and Mattox, D. M., J. Vac. Sci. Technol.,Google Scholar
19. Window, B., Sharples, F., and Savvides, N., J. Vac. Sci. Technol. A 6 (4), 2333 (1988)CrossRefGoogle Scholar
20. Muller, K.-H., Phys. Rev. B, 35 (15), 7906 (1987)CrossRefGoogle Scholar