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Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs

Published online by Cambridge University Press:  10 February 2011

X. R. Huang ,
M. Dudley ,
W. M. Vetter ,
W. Huang ,
S. Wang  and
C. H. Carter Jr.
X. R. Huang
Affiliation:
Dept. of Materials Science & Engineering, SUNY at Stony Brook, NY 11794-2275
M. Dudley
Affiliation:
Dept. of Materials Science & Engineering, SUNY at Stony Brook, NY 11794-2275
W. M. Vetter
Affiliation:
Dept. of Materials Science & Engineering, SUNY at Stony Brook, NY 11794-2275
W. Huang
Affiliation:
Dept. of Materials Science & Engineering, SUNY at Stony Brook, NY 11794-2275
S. Wang
Affiliation:
Dept. of Materials Science & Engineering, SUNY at Stony Brook, NY 11794-2275
C. H. Carter Jr.
Affiliation:
Cree Research, Inc., 4600 Silicon Drive, Durham, NC 27703
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Abstract

The topographic contrast of superscrew dislocations in 6H-SiC crystals has been studied by synchrotron white-beam x-ray topography in the Bragg reflection geometry. The diffraction images of these dislocations are simulated using a ray-tracing method. Systematical simulations, which coincide with the dislocation images taken by back-and grazing-reflection topography, clearly reveal the kinematic diffraction mechanisms of the superscrew dislocation, and illustrate that synchrotron reflection topography is capable of providing accurate descriptions of the strain fields, the Burgers vector magnitudes, and the senses of these dislocations. In addition, our experiments and simulations demonstrate straightforwardly the relation between the topographic contrast and the lattice distortions, and therefore the general mechanisms underlying contrast formation of defect images in synchrotron reflection topographs are provided.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 71
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

[1] Sauvage, M. and Petroff, J. F., in: Synchrotron Radiation Research, Eds. Winick, H. and Doniach, S., Plenum Press, New York, 1980.Google Scholar
[2] Tanner, B. K., X-ray Diffraction Topograph , Pergamon Press, Oxford, 1976.Google Scholar
[3] Riglet, M., Sauvage, M., Petroff, J. F., and Epelboin, Y., Philos. Mag. A 42, p. 339 (1980).Google Scholar
[4] Barnett, S. J., Keir, A. M., Gullis, A. G., Johnson, A. D., Jefferson, J., Smith, G. W., Martin, T., Whitehouse, C. R., Lacey, G., Clark, G. F., Tanner, B. K., Spirkl, W., Lunn, B., Hogg, J. C., Ashu, P., Hagston, W. E., Castelli, C. M., J. Phys. D: Apply. Phys. 28, p. A17 (1995).Google Scholar
[5] Dudley, M., Wang, S., Huang, W., Carter, C. H. Jr, Tsvetkov, V. F., and Fazi, C., J. Phys. D: Appl. Phys. 28, p. A63 (1995).Google Scholar
[6] Wang, S., Dudley, M., Carter, C. H. Jr, and Kong, H. S., Mat. Res. Soc. Symp. Proc. 339, p. 735 (1994).Google Scholar
[7] Dudley, M., Si, W., Wang, S., Carter, C. H. Jr, Glass, R., Tsvetkov, V., I1 Nuovo Cimento 19D, p. 153 (1997).Google Scholar
[8] Epelboin, M., Materials Science and Engineering 73, 1 (1985); C. A. M. Carvalho, and Y. Epelboin, Acta Crystallogr. A 49, p. 467 (1993).Google Scholar
[9] Eshelby, J. D. and Stroth, A. N., Philos. Mag. 42, p. 1401 (1951).Google Scholar
[10] Wang, S., Ph. D. Thesis, State University of New York at Stony Brook, 1995.Google Scholar
[11] Klapper, H., Crystals 13, p. 109 (1991)Google Scholar