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Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

Published online by Cambridge University Press:  01 February 2011

Bijandra Kumar ,
Mickaël Castro ,
Jianbo Lu  and
Jean-François Feller
Bijandra Kumar
Affiliation:
[email protected], Euorpean University of Brittany, LIMATB, Lorient, France
Mickaël Castro
Affiliation:
[email protected], European University of Brittany, LIMATB, rue saint maude, Lorient, 56321, France, (+33) 2 97 87 45 80, (+33) 2 97 87 45 88
Jianbo Lu
Affiliation:
[email protected], Euorpean University of Brittany, LIMATB, Lorient, France
Jean-François Feller
Affiliation:
[email protected], European University of Brittany, LIMATB, Lorient, France
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Abstract

Organic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

Keywords

nanostructureelectrical propertiesscanning probe microscopy (SPM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1143: Symposium KK – Transport Properties in Polymer Nanocomposites , 2008 , 1143-KK02-06
Copyright
Copyright © Materials Research Society 2009

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References

REFFERENCE

1. Rao, C. N., Kumar, S., Govindaraj, A. and Nath, M., ChemPhysChem. 2, 78 (2001).Google Scholar
2. Baughman, R. H., Zakhidov, A. and de Heer, W. A., Science 297, 787 (2002).Google Scholar
3. Zhao, Q., Gan, Z. and Zhuang, Q., Electroanalysis 14, 1609 (2002).Google Scholar
4. Yu, H., Cao, T., Zhou, L., Gu, E., Yu, D. and Jiang, D., Sens. Actuators B 119, 512–515 (2006).Google Scholar
5. Severin, E. J., Doleman, B. J. and Lewis, N. S., Analytical Chemistry, 4, 658–668 (2000).Google Scholar
6. Feller, J. F. and Grohens, Y., Synthetic Metals, 154, 193–196 (2005).Google Scholar
7. Feller, J. F., Guezenoc, H, Bellegou, H., Grohens, Y., Macromolecular Symposia, 222, 273–280 (2005).Google Scholar
8. Anderson, N., Anger, P., Hartschuh, A. and Novotny, L. Nano Lett. 6, 744–749 (2006).Google Scholar
9. Visit, for example, http://www.veeco.com/ (application notes).Google Scholar
10. Leatherman, G., Durantini, E.N., Gust, D., Moore, T.A., Moore, A.L., Stone, S., Zhou, Z., Rez, P., Liu, Y.Z. and Lindsay, S., J. Phys. Chem. B 103, 4006 (1999).Google Scholar
11. Wold, D.J. and Frisbie, C.D., Am, J.. Chem. Soc. 123, 5549 (2001).Google Scholar
12. Alperson, B., Cohen, S., Rubinstein, I. and Hodes, G., Phys. Rev. B. 52 R17017 (1995).Google Scholar
13. DI/Veeco. Application note 42. Tunneling AFM and conductive AFM with NanoScope(R) AFM; (2000).Google Scholar
14. Goh, H. W., Goh, S. H., Xu, G. Q., Pramoda, K. P. and Zhang, W. D., Chem. Phys. Lett. 373 277–83, (2003)Google Scholar
15. Someya, T., Small, J., Kim, P., Nuckolls, C. and Yardley, J. T., Nano Lett. 3 877–81, (2003)Google Scholar