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Concentration and Distribution of ER, AL and P in Silica-Based Optical Fiber Preforms by Sims

Published online by Cambridge University Press:  21 February 2011

D. W. Oblas
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
T. Wei
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
W. J. Miniscalco
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
B. T. Hall
Affiliation:
GTE Laboratories Inc., 40 Sylvan Road, Waltham, MA 02254
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Abstract

Secondary ion mass spectrometry (SIMS) was used to measure the Er, Al and P distributions across (perpendicular to) and along (parallel to) the axis of Er3+-doped silica based preforms and fibers prepared by a solution doping technique. Specially prepared low-melting silicate glass standards containing known concentrations of Er were used to calibrate the spectrometer to obtain a semi-quantitative measurement of the Er concentration. It was found that the Er concentration can vary along a 4-cm section of the preform by as much as a factor of two. The Al concentration also changed along the length of the preform, but to a smaller degree. Finally, instrumental limitations for measuring the Er, Al and P distributions in the optical fiber samples were determined.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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