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Comparison of the Effect of Light Soaking in Porous Silicon and a-Si:H

Published online by Cambridge University Press:  01 February 2011

N. P. Mandal
Affiliation:
Department of Physics, Indian Institute of Technology, Kanpur, 208016, India.
S. C. Agarwal
Affiliation:
Department of Physics, Indian Institute of Technology, Kanpur, 208016, India.
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Abstract

In undoped a-Si:H thin films, light soaking (LS) decreases dark current and photocurrent and increases the electron spin resonance signal monotonically with increasing exposure time, (Staebler-Wronski Effect, SWE). On the other hand, in porous silicon (PS) the light-soaking effect is non-monotonic. For short durations, LS increases dark current, photo current and photoluminescence and decreases the ESR signal. Long exposures of PS, however, have the opposite effect, which is similar to the SWE observed in a-Si:H. All metastabilities in PS as well as in a-Si:H can be removed by annealing, but not by exposure to infrared light. We find that the combined effect of NH3 vapor exposure and LS on PS yields a final state that depends upon the order in which the two steps are performed. This is in contrast to the corresponding observation in a-Si:H. We could arrest the light-induced degradation of PS over long times by coating with a thin polystyrene, which resulted in constant PL and ESR intensities. However, in the case of a-Si:H the polymer coating decreases the SWE, but does not eliminate it. The results can be understood, if we were to propose that LS affects the surface in PS, but affects mainly the bulk in a-Si:H.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

1See for a review, Fritzsche, H., Annual Review of Material Science 31, 47 (2001).10.1146/annurev.matsci.31.1.47Google Scholar
2 Staebler, D. L. and Wronski, C., Appl. Phys. Lett. 31, 292 (1977).10.1063/1.89674Google Scholar
3For a review, see for example, Bisi, O., Ossicini, S. and Pavesi, L., Surf. Sci. Reports 38, 1 (2000).10.1016/S0167-5729(99)00012-6Google Scholar
4 Mandal, N. P. and Agarwal, S. C., Mater. Res. Soc. Symp. Proc. Vol. 762, A17.18, Editors: J. R. Abelson, G. Ganguly, H. Matsumura, J. Robertson, and E. A. Schiff, San Francisco, Spring 2003.10.1557/PROC-762-A17.18Google Scholar
5 Tanielian, M., Phil. Mag. B 45, 435 (1982).10.1080/01418638208227449Google Scholar
6 Anandan, C., Mukherjee, C., Seth, T., Dixit, P. N. and Bhattacharya, R., Appl. Phys. Lett. 68, 835 (1996).Google Scholar
7 Mandal, N. P., Dey, S. and Agarwal, S. C., Mater. Res. Soc. Symp. Proc. Vol. 737, F3.51, Editors: V. I.Klimov, J. M. Buriak, D.M. Wayner, F. Priolo, B. White, and L. Tsybeskov, Boston, Fall 2002.10.1557/PROC-737-F3.51Google Scholar
8 Mandal, N. P., Dey, S. and Agarwal, S. C., Thin Solid Films, 451-452, 375 (2004).10.1016/j.tsf.2003.11.068Google Scholar
9 Mandal, N. P., Ph.D. thesis at I.I.T. Kanpur (submitted 2004).Google Scholar
10 Kanemitsu, Y., Uto, H., and Masumoto, Y., Phys. Rev. B 48, 2827 (1993).10.1103/PhysRevB.48.2827Google Scholar
11 Balberg, I., Phys. Rev. Lett. 78, 2433 (1997).Google Scholar
12 Stutzmann, M., Jackson, W. B. and Tsai, C. C., Phys. Rev. B 32, 23 (1985); R. Prasad and S. R. Shenoy, Phys. Lett. A 218, 85 (1996).10.1103/PhysRevB.32.23Google Scholar
13 Mandal, N. P., Sharma, Ashutosh and Agarwal, S. C. (Communicated).Google Scholar
14 Kakalios, J. and Fritzsche, H., Phys. Rev. Lett. 53, 1602 (1984).10.1103/PhysRevLett.53.1602Google Scholar
15 Agarwal, S.C. and Guha, S., Phys. Rev. B 32, 8469 (1985).10.1103/PhysRevB.32.8469Google Scholar
16 Mandal, N P, Sharma, Ashutosh and Agarwal, S C, Solid State Commun. 129, 183 (2004).10.1016/j.ssc.2003.09.030Google Scholar
17 Kumar, S. and Agarwal, S. C., Appl. Phys. Lett. 45, 575 (1984).10.1063/1.95286Google Scholar