Hostname: page-component-6bf8c574d5-mggfc Total loading time: 0 Render date: 2025-02-18T05:51:08.829Z Has data issue: false hasContentIssue false
  • English
  • Français

A Comparison of Small Angle Neutron Scattering and X-Ray Diffraction Studies of Cobalt Precipitates in A Cu-0.95 at. % Co Alloy

Published online by Cambridge University Press:  26 February 2011

S. Spooner ,
S. Iida  and
B. C. Larson
S. Iida
Affiliation:
Solid State Division Oak Ridge National Laboratory, P. O. Box X, Oak Ridge, TN 37831
Get access

Abstract

A detailed comparison of small-angle scattering (SANS) and large angle x-ray diffraction methods of characterization of precipitates was undertaken. Cobalt-rich precipitates on the order of 50 Å developed after a 17 hour anneal at 570°C were studied in a single crystal sample with SANS and with diffuse x-ray scattering near the (400)Bragg peak. Each scattering data set was analyzed independently in terms of a distribution of precipitate sizes; a detailed comparison is made of the size distribution obtained. A small interparticle interference effect is seen.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 79
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. LeGoues, F. K., Aaronson, H. I., Lee, Y. W. and Fix, G. J., in Proceeding of an International Conference on Solid-Solid Phase Transformations, edited by Aaronson, H. I. et al. (The Metallurgical Society of AIME, New York, 1982). p.427–431.Google Scholar
2. Wendt, H. and Haasen, P., Scripta Met. 19, 1053–1058 (1985).Google Scholar
3. Wagner, W., J. Phys. F 16, L239–L243 (1986).Google Scholar
4. Ernst, M., Schelten, J. and Schmatz, W., Phys. Stat. Sol. (a) 7, 469–476; 477-483 (1971).Google Scholar
5. Eguchi, T., Tomokiyo, Y, Oki, K. and Seno, Y., Mat. Res. Soc. Symp. Proc. Vol. 21, 474–480 (1984).Google Scholar
6. Koehler, W. C. and Hendricks, R. W., J. Appl. Phys. 50, 1951 (1979).Google Scholar
7. Wignall, G. D. and Bates, F. S., to be published in J. Appl. Cryst.Google Scholar
8. Larson, B. C. et al., this proceedings.Google Scholar
9. Brill, O. L. and Schmidt, P. W., J. Appl. Phys. 39, 2274 (1968).CrossRefGoogle Scholar
10. Servi, I. S. and Turnbull, D., Acta Met. 14, 161–169 (1966).Google Scholar