Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-29T09:23:10.191Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparative Optical Studies of Chemically Synthesized Silicon Nanocrystals

Published online by Cambridge University Press:  15 February 2011

Gildardo R. Delgado ,
Howard W.H. Lee ,
Susan M. Kauzlarich  and
Richard A. Bley
Gildardo R. Delgado
Affiliation:
Lawrence Livermore National Laboratory, Photonics Group, P.O. Box 808, L-174, Livermore CA 94551 University of California-Davis, Department of Applied Physics, Livermore, CA
Howard W.H. Lee
Affiliation:
Lawrence Livermore National Laboratory, Photonics Group, P.O. Box 808, L-174, Livermore CA 94551
Susan M. Kauzlarich
Affiliation:
University of California-Davis, Department of Chemistry, Davis, CA
Richard A. Bley
Affiliation:
University of California-Davis, Department of Chemistry, Davis, CA
Get access

Abstract

We studied the optical and electronic properties of silicon nanocrystals derived from two distinct fabrication procedures. One technique uses a controlled chemical reaction. In the other case, silicon nanocrystals are produced by ultrasonic fracturing of porous silicon layers. We report on the photoluminescence, photoluminescence excitation, and absorption spectroscopy of various size distributions derived from these techniques. We compare the different optical properties of silicon nanocrystals made this way and contrast them with that observed in porous silicon. Our results emphasize the dominant role of surface states in these systems as manifested by the different surface passivation layers present in these different fabrication techniques. Experimental absorption measurements are compared to theoretical calculations with good agreement. Our results provide compelling evidence for quantum confinement in both types of Si nanocrystals. Our results also indicate that the blue emission from very small Si nanocrystals corresponds to the bandedge emission, while the red emission arises from traps.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 452 , 1996 , 177
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. See, for example, Mat. Res. Soc. Symp. Proc. 298, (1993) or J. Lumin., 57, (1993).Google Scholar
2.Porous Silicon, Feng, Z.C. and Tsu, R. eds., (World Scientific Publishing Company, River Edge, New Jersey, 1994).Google Scholar
3.Porous Silicon Science and Technology Vial, J.C. and Derrien, J. eds., (Springer-Verlag, New York, 1995).Google Scholar
4.Koch, F., Petrova-Koch, V., and Muschik, T., J. of Lumin., 57, 271 (1993).Google Scholar
5.Wu, J.J., Flagan, R.C., J. Appl. Phys., 61, 1365 (1987).Google Scholar
6.Hayashi, S., Tanimoto, S., Yamamoto, K., J. Appl. Phys., 68, 5300 (1990).Google Scholar
7.Okada, R., Ijima, S., Appl. Phys. Lett., 58, 1662 (1991).Google Scholar
8.Ijima, S., Jpn. J. Appl. Phys., 26, 357 (1987).Google Scholar
9.Saito, Y., J. Cryst. Growth, 47, 61 (1979).Google Scholar
10.Heath, J.R., Science, 258, 1131 (1992).Google Scholar
11.Heinrich, J.L., Curtis, C.L., Credo, G.M., Kavanagh, K.L., Sailor, M.J., Science, 255, 66 (1992).Google Scholar
12.Littau, K.A., Szajowshki, P.J., Muller, A.J., Kortan, A.R., Brus, L.E., J. Phys. Chem. 97, 1224 (1993).Google Scholar
13.Bley, R.A. and Kauzlarich, S.M., J. Am. Chem. Soc, in press, (1996).Google Scholar
14.Delgado, G.R. and Lee, H.W.H., Phys. Rev. Lett, (submitted).Google Scholar
15.Dellerue, C., Allan, G., Lannoo, M., Phys. Rev. B. 48, 11024 (1993).Google Scholar
16.Wang, L.W., Zunger, A., Phys. Rev. Lett. 73, 1039 (1994).Google Scholar
17. See, for example, Griscom, D.L., J. Ceram. Soc. Jpn. 99, 923 (1991).Google Scholar
18.Dellerue, C., Allan, G., Martin, E. and Lannoo, M., Porous Silicon Science and Technology, Vial, J.C. and Derrien, J. eds., (Springer-Verlag, New York, 1995), page 91.Google Scholar