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Comparative Experimental Study of X-Ray Absorption Spectroscopy and Electron Energy Loss Spectroscopy on Passivated U Surfaces

Published online by Cambridge University Press:  26 February 2011

Art J. Nelson
Affiliation:
[email protected], LLNL, CMLS MSTD, 7000 East Avenue, Livermore, CA, 94550, United States, 925-422-6488, 925-422-6892
W. J. Moberlychan
Affiliation:
[email protected], LLNL, CMS MSTD, 7000 East Avenue, Livermore, CA, 94550, United States
R. A. Bliss
Affiliation:
[email protected], LLNL, CMS MSTD, 7000 East Avenue, Livermore, CA, 94550, United States
W. J. Siekhaus
Affiliation:
[email protected], LLNL, CMS MSTD, 7000 East Avenue, Livermore, CA, 94550, United States
T. E. Felter
Affiliation:
[email protected], LLNL, CMS MSTD, 7000 East Avenue, Livermore, CA, 94550, United States
J. D. Denlinger
Affiliation:
[email protected], LBL, ALS, 1 Cyclotron Road, Berkeley, CA, 94720, United States
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Abstract

X-ray absorption spectroscopy and electron energy loss spectroscopy are complementary analytical techniques on energy and spatial resolution. These techniques are based on the same fundamental physical process of core excitation with either an incident photon or incident electron. In the proper experimental configuration the electron and photon inelastic scattering amplitudes are comparable and thus the x-ray and electron absorption edges look identical. We have applied these two complementary analytical techniques to investigate the electronic structure of C ion implanted U. Implantation of C+ ions into U238 has been shown to produce a physically and chemically modified surface layer that passivates the surface preventing further air oxidation and corrosion. Comparison of the resultant spectra reveal that transitions between the initial state and a series of final states yield numerous strong features at the absorption edge that can provide structural information and information on the local chemical environment, including the character of the U 5f state.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

1. Fujikawa, T., Takatoh, S. and Usami, S., Jpn. J. Appl. Phys. 27, 348 (1988).Google Scholar
2. Fujikawa, T., Takatoh, S. and Usami, S., Jpn. J. Appl. Phys. 28, 1683 (1989).Google Scholar
3. Yikegaki, T., Yiwata, N., Fujikawa, T. and Usami, S., Jpn. J. Appl. Phys. 29, 1362 (1990).Google Scholar
4. Hitchcock, A. P., Jpn. J. Appl. Phys. 32, Suppl. 32–2, 176 (1993).Google Scholar
5. Arkush, R., Mintz, M. H. and Shamir, N., J. Nucl. Mater. 281, 182 (2000).Google Scholar
6. Nelson, A. J., Felter, T. E., Wu, K. J., Evans, C., Ferreira, J. L., Siekhaus, W. J., and McLean, W., Surf. Sci. 600, 1319 (2006).Google Scholar
7. Wu, Z. Y., Ouvard, G., Gressier, P. and Natoli, C. R., Phys. Rev. B 55, 10382 (1997).Google Scholar
8. Zhu, Y., Moodenbaugh, A. R., Schneider, G., Davenport, J. W.. Vogt, T., Li, Q., Gu, G., Fischer, D. A. and Tafto, J., Phys. Rev. Lett. 88, 247002 (2002).Google Scholar
9. Rojas, T. C., SanchezLopez, J. C., Greneche, J. M., Conde, A. and Fernandez, A., J. Mat. Sci. 39, 4877 (2004).Google Scholar
10. Harvey, A., Guo, B., Kennedy, I., Risbud, S. and Leppert, V., J. Phys.: Condens. Matter 18, 2181 (2006).Google Scholar
11. Powell, G. L., Y12 Plant, Oak Ridge, Tennessee.Google Scholar
12. McGillivray, G. W., Geeson, D. A. and Greenwood, R. C., J. Nucl. Mat. 208, 81 (1994).Google Scholar
13. Kalkowski, G., Kaindl, G., Brewer, W. D. and Krone, W., Phys. Rev. B 35, 2667 (1987).Google Scholar
14. van Kampen, P., Gerth, Ch., Martins, M., Carroll, P. K., Hirsch, J., Kennedy, E. T., Meighan, O., Mosnier, J. P., Zimmermann, P., and Costello, J. T., Phys. Rev. A 61, 062706 (2000).Google Scholar
15. Egerton, R. F., Electron Energyloss Spectroscopy in the Electron Microscope, second edition (1996 New York, Plenum), p.221.Google Scholar
16. Moser, H. R. and Wendin, G., Phys. Rev. B 44, 6044 (1991).Google Scholar