Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-27T02:20:46.906Z Has data issue: false hasContentIssue false
  • English
  • Français

Combined Excitation Emission Spectroscopy of Europium ions in GaN and AlGaN Films

Published online by Cambridge University Press:  01 February 2011

V. Dierolf ,
Z. Fleischman ,
C. Sandmann ,
A. Wakahara ,
T. Fujiwara ,
C. Munasinghe  and
A. Steckl
V. Dierolf
Affiliation:
Department of Physics and Center for Optical Technologies, Lehigh University, Bethlehem, PA 18015, USA
Z. Fleischman
Affiliation:
Department of Physics and Center for Optical Technologies, Lehigh University, Bethlehem, PA 18015, USA
C. Sandmann
Affiliation:
Department of Physics and Center for Optical Technologies, Lehigh University, Bethlehem, PA 18015, USA
A. Wakahara
Affiliation:
Toyohashi University of Technology
T. Fujiwara
Affiliation:
Toyohashi University of Technology
C. Munasinghe
Affiliation:
Nanoelectronics Laboratory, University of Cincinnati, Cincinnati, OH 45221-0030
A. Steckl
Affiliation:
Nanoelectronics Laboratory, University of Cincinnati, Cincinnati, OH 45221-0030
Get access

Abstract

Site-selective combined excitation emission spectroscopy studies have been performed on Eu-doped GaN and numerous sites have been identified. Relative numbers and broadening of these peaks has been investigated for different growth conditions and for increasing AL content of the AlxGa1-xN alloy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 866 , 2005 , V3.6
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Steckl, A. J., and Zavada, J. M., Mat. Res. Soc. Bulletin, vol. 24, no.9, pp. 33–38, 1999.Google Scholar
[2] Steckl, A. J., Heikenfeld, J. C., Lee, D. S., Garter, M. J., Baker, C. C., Wang, Y., and Jones, R., IEEE J. Sel. Top. Quantum Electron 8, 749 (2002).Google Scholar
[3] Park, J. H. and Steckl, A. J., Appl. Phys. Lett. 85, 4588 (2004).Google Scholar
[4] Munasinghe, C. and Steckl, A. J., 12th International Workshop on Inorganic and Organic Electroluminescence and 2004 International Conference on the Science and Technology of Emissive Display and Lighting, Toronto, Canada, pp. 341, Sept. 2004.Google Scholar
[5] Heikenfeld, J., Garter, M., Lee, D. S., Birkhahn, R., and Steckl, A. J., Appl. Phys. Lett. 75, 1189 (1999).Google Scholar
[6] Dierolf, V., Sandmann, C., Zavada, J., Chow, P., and Hertog, B., J. Appl. Phys. 95, 5464 (2004).Google Scholar
[7] Hömmerich, U., Nyein, Ei Ei, Lee, D.S., Heikenfeld, J., Steckl, A.J., Zavada, J.M., Materials Science and Engineering B105, 91 (2003).Google Scholar
[8] Siegle, H., Kaschner, A., Hoffmann, A., Broser, I., Thompson, C., Einfeldt, S., and Hommel, D., Phys. Rev. B 58, 13619 (1998).Google Scholar
[8] Kuball, M., Surf. Interface Anal., 31: 987–999 (2001).Google Scholar