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Combinatorial Approach for Thermoelectric Materials through Bulk Composition-Spreads and Diffusion Multiples

Published online by Cambridge University Press:  01 February 2011

Atsushi Yamamoto ,
Teruo Noguchi ,
Haruhiko Obara ,
Kazuo Ueno ,
Satoaki Ikeuchi ,
Tooru Sugawara ,
Kenji Shimada ,
Youichi Takasaki  and
Yoshikazu Ishii
Atsushi Yamamoto
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology (AIST), Energy Technology Research Institute, Umezono 1-1-1, Tsukuba, 3058568, Japan, +81-2986115776, +81-2986115340
Teruo Noguchi
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology (AIST), Energy Technology Research Institute, Umezono 1-1-1, Tsukuba, 3058568, Japan
Haruhiko Obara
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology (AIST), Energy Technology Research Institute, Umezono 1-1-1, Tsukuba, 3058568, Japan
Kazuo Ueno
Affiliation:
[email protected], National Institute of Advanced Industrial Science and Technology (AIST), Energy Technology Research Institute, Umezono 1-1-1, Tsukuba, 3058568, Japan
Satoaki Ikeuchi
Affiliation:
[email protected], ULVAC-RIKO, Inc., Yokohama, 2260006, Japan
Tooru Sugawara
Affiliation:
[email protected], ULVAC-RIKO, Inc., Yokohama, 2260006, Japan
Kenji Shimada
Affiliation:
[email protected], ULVAC-RIKO, Inc., Yokohama, 2260006, Japan
Youichi Takasaki
Affiliation:
[email protected], ULVAC-RIKO, Inc., Yokohama, 2260006, Japan
Yoshikazu Ishii
Affiliation:
[email protected], ULVAC-RIKO, Inc., Yokohama, 2260006, Japan
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Abstract

In this paper we describe a new attempt of high-throughput screening of thermoelectric materials by combining the use of the “bulk composition-spread (CS)” or “bulk diffusion multiples (DM)” and the “scanning thermal probe microanalyzer (STPM).” The (Bi2Te3)1-x(Sb2Te3)x (0<x<1) and Ni1-xCux (0<x<1) bulk CS samples were prepared by conventional powder metallurgy method by using mechanical alloying and spark plasma sintering process. The Ni-Cu-X (X=Sn, In, Bi.) DM sample was prepared by post-heating of the CS samples in a molten metal. The two dimensional distributions of Seebeck coefficient and the thermal conductivity of the cross section of the CS and DM samples which composed of graded composition were visualized by using STPM at room temperature. The composition variation was checked by EDX. The relationship between composition and the thermoelectric properties was successfully determined by using the mapping results. The time required for mapping out the 100x100 pixel image was 8 to 11 hours. The total time required for this set of the screening experiment, from sample preparation to the final conclusion, was within 24 hours. For samples Ni-Cu-X DM the diffusion length of the elements at the interface can be large as 1mm and it was found that STPM is applicable to visualize the thermoelectric properties at the region of interest.

Keywords

combinatorial synthesisthermoelectricityalloy
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1024: Symposium A – Combinatorial Methods for High-Throughput Materials Science , 2007 , 1024-A01-05
Copyright
Copyright © Materials Research Society 2008

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