Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-09T03:11:04.639Z Has data issue: false hasContentIssue false
  • English
  • Français

Co-implantation : A simple way to grow doped Si nanocrystals embedded in SiO2

Published online by Cambridge University Press:  20 July 2012

Daniel Mathiot ,
Rim Khelifi ,
Dominique Muller  and
Sébastien Duguay
Daniel Mathiot
Affiliation:
Institut d’Électronique du Solide et des Systèmes (InESS, Université de Strasbourg and CNRS), 23 rue du Loess, B.P. 20, 67037 Strasbourg cedex 2, France.
Rim Khelifi
Affiliation:
Institut d’Électronique du Solide et des Systèmes (InESS, Université de Strasbourg and CNRS), 23 rue du Loess, B.P. 20, 67037 Strasbourg cedex 2, France.
Dominique Muller
Affiliation:
Institut d’Électronique du Solide et des Systèmes (InESS, Université de Strasbourg and CNRS), 23 rue du Loess, B.P. 20, 67037 Strasbourg cedex 2, France.
Sébastien Duguay
Affiliation:
GPM, Université et INSA de Rouen, UMR CNRS 6634, BP 12, Avenue de l’université, 76801 Saint Etienne du Rouvray, France.
Get access

Abstract

Co-implantation, with overlapping implantation projected ranges, of Si and of the doping species (P, As, or B), followed by a single thermal anneal step, is proved to be a viable route to form doped Si-nc’s embedded in SiO2, with diameters of a few nanometers. Extensive results of the evolution of the Si-nc’s related photoluminescence, as a function of the dopant implanted dose, are presented and discussed. Atomic Probe Tomography (APT) is used to image directly the spatial distribution of the various species at the atomic scale. The 3D APT data demonstrate that n-type dopant atoms (P and As) are efficiently introduced in the "bulk" of the Sinanocrystals, whereas B atoms are preferentially located at their periphery, at the Si/SiO2 interface.

Keywords

ion-beam processingSiluminescence
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1455: Symposium II – Nanoscale Materials Modification by Photon, Ion, and Electron Beams , 2012 , mrss12-1455-ii08-21
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Normand, P., Kapetanakis, E., Dimitrakis, P., Skarlatos, D., Beltsios, K., Tsoukalas, D., Bonafos, C., Ben Assayag, G., Cherkashin, N., Claverie, A., Van Den Berg, J.A., Soncini, V., Agarwal, A., Ameen, M., Perego, M., Fanciulli, M., Nucl. Instrum. Meth. B 216, 228 (2004)10.1016/j.nimb.2003.11.039Google Scholar
2. Pavesi, L., Dal Negro, L., Mazzoleni, C., Franzò, G., and Priolo, F., Nature 408, 440 (2000)10.1038/35044012Google Scholar
3. Cho, E.C., Park, S., Hao, X., Song, D., Conibeer, G., Park, S.C., and Green, M. A., Nanotechnology 19, 245201 (2008)10.1088/0957-4484/19/24/245201Google Scholar
4. Chan, T.L., Tiago, M.L., Kaxiras, E., and Chelikowsky, J.R., Nano Lett. 8, 596 (2008)10.1021/nl072997aGoogle Scholar
5. Fuji, M., Toshikiyo, K., Takase, Y., Yamaguchi, Y., and Hayashi, S., J. Appl. Phys. 94, 1990 (2003)10.1063/1.1590409Google Scholar
6. Saito, K., Fukata, N. and Hirakuri, K., Appl. Phys. Lett. 94, 161902 (2009)10.1063/1.3120768Google Scholar
7. Perego, M., Bonafos, C. and Fanciulli, M., Nanotechnology 21, 025602 (2010)10.1088/0957-4484/21/2/025602Google Scholar
8. Bonafos, C., Colombeau, B., Altibelli, A., Carrada, M., Ben Assayag, G., Garrido, B., Lopez, M., Perez-Rodriguez, A., Morante, J.R., and Claverie, A., Nucl. Instrum. Meth. B 178, 17 (2004)10.1016/S0168-583X(01)00497-9Google Scholar
9. Garrido Fernandez, B., Lopez, M., Garcia, C., Perez-Rodriguez, A., Morante, J.R, Bonafos, C., Carrada, M., and Claverie, A., J. Appl. Phys. 91, 798 (2002)10.1063/1.1423768Google Scholar
10. Duguay, S., Colin, A., Mathiot, D., Morin, P., and Blavette, D., J. Appl. Phys. 108, 034911 (2010).10.1063/1.3466783Google Scholar
11. Talbot, E., Lardé, R., Gourbilleau, F., Dufour, C., Pareige, P., EPL 87, 26004 (2009).10.1209/0295-5075/87/26004Google Scholar
12. Philippe, T., Duguay, S., Mathiot, D., and Blavette, D., J. Appl. Phys. 109, 023501 (2011)10.1063/1.3533416Google Scholar
13. Gault, B., Vurpillot, F., Vella, A., Gilbert, M., Menand, A., Blavette, D., and Deconihout, B., Rev. Sci. Instrum. 77, 043705 (2006).10.1063/1.2194089Google Scholar