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Circular AFM Mode: A New AFM Mode for Investigating Surface Properties

Published online by Cambridge University Press:  18 May 2011

Olivier Noel ,
Pierre-Emmanuel Mazeran  and
Hussein Nasrallah
Olivier Noel
Affiliation:
Molecular Landscapes & Biophotonics Group, LPEC UMR CNRS 6087, Université du Maine, Le Mans, France
Pierre-Emmanuel Mazeran
Affiliation:
Surface Mechanics Group, Laboratoire Roberval, UMR CNRS 6253, Université de Technologie de Compiègne, France
Hussein Nasrallah
Affiliation:
Molecular Landscapes & Biophotonics Group, LPEC UMR CNRS 6087, Université du Maine, Le Mans, France
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Abstract

For the first time, a new AFM mode is presented that simultaneously allows the measuring of adhesion and friction forces at different constant and continuous sliding velocities. Our methodology consists of implementing a circular relative displacement of the contact to reach a constant sliding velocity, with no stop periods. Some of the main advantages of performing a circular displacement is that continuous and high sliding velocities (more than 1 mm/s) can be reached compared to the low sliding velocities (up to 10 μm/s) available when using commercial AFM. Also, a stationary state is reached when doing measurements. Moreover, the circular mode can be coupled with the classical operating mode, for instance, force spectrum. Main applications of this circular mode are related to metrological measurements in physics that require high speed displacements. As an example, we report the evolution of friction and adhesive forces measured in air at different high sliding velocities.

Keywords

scanning probe microscopy (SPM)adhesiontribology
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-vv04-11
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

[1] Noel, O., Mazeran, P-E., Nasrallah, H., AFM Circular Mode, Patent in 2010.Google Scholar
[2] Butt, H.J., Cappella, B., Kappl, M., Force measurements with the atomic force microscope: Technique, interpretation and applications, Surface Science Reports, 59 (2005) 1–152.Google Scholar
[3] Scheuring, S., Dufrene, Y.F., Atomic force microscopy: probing the spatial organization, interactions and elasticity of microbial cell envelopes at molecular resolution, Molecular Microbiology, 75 (2009) 1327–1336.Google Scholar
[4] Manalis, S.R., Minne, S.C., Quate, C.F., Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor, Applied Physics Letters, 68 (1996) 871–873.Google Scholar
[5] McMaster, T.J., Brayshaw, D., Miles, M.J., Walsby, A.E., Dunton, P., A new ultra high speed AFM technique for biophysics: 3-diemensional imaging of surfaces, molecules and processes with true millisecond resolution, Biophysical Journal, 88 (2005) 541A-541A.Google Scholar
[6] Parot, P., Dufrene, Y.F., Hinterdorfer, P., Le Grimellee, C., Navajas, D., Pellequer, J.L., Scheuring, S., Past, present and future of atomic force microscopy in life sciences and medicine, Journal of Molecular Recognition, 20 (2007) 418–431.Google Scholar
[7] Casuso, I., Kodera, N., Le Grimellec, C., Ando, T., Scheuring, S., Contact-Mode High-Resolution High-Speed Atomic Force Microscopy Movies of the Purple Membrane, Biophysical Journal, 97 (2009) 1354–1361.Google Scholar