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Charge Injection into Bottom-Contact Pentacene Thin-Film Transistors

Published online by Cambridge University Press:  01 February 2011

Yi Hong
Affiliation:
[email protected], Electrical Engineering Division, Engineering Department, University of Cambridge, 9, JJ Thomson Avenue, Cambridge, N/A, CB3 0FA, United Kingdom
Feng Yan
Affiliation:
[email protected], University of Cambridge, Engineering Department, Cambridge, N/A, CB3 0FA, United Kingdom
Piero Migliorato
Affiliation:
[email protected], University of Cambridge, Engineering Department, Cambridge, N/A, CB3 0FA, United Kingdom
S H Han
Affiliation:
[email protected], Kyung Hee University, Advanced Display Research Center, Seoul, N/A, 130-701, Korea, Republic of
Jin Jang
Affiliation:
[email protected], Kyung Hee University, Advanced Display Research Center, Seoul, N/A, 130-701, Korea, Republic of
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Abstract

We investigate the contact of bottom-contact pentacene-based thin-film transistors, with Au source/drain electrode. By separating the voltage drop at the contact from the source-drain voltage, the current-voltage characteristic of the injection contact is obtained. The contact characteristics are in a good agreement with a model of carrier injection from a metal electrode into a disordered hopping system.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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