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Characterization of ZnSe Nanoparticles Prepared Using Ultrasonic Radiation Method

Published online by Cambridge University Press:  09 August 2011

Jianfeng Xu ,
Wei Ji ,
Sing-Hai Tang  and
Wei Huang
Jianfeng Xu
Affiliation:
Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260, Republic of Singapore
Wei Ji
Affiliation:
Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260, Republic of Singapore
Sing-Hai Tang
Affiliation:
Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260, Republic of Singapore
Wei Huang
Affiliation:
Institute of Materials Research and Engineering, National University of Singapore, Singapore 119260, Republic of Singapore
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Abstract

ZnSe nanoparticles with an average size of 15 nm were prepared using the ultrasonic radiation method. The characterization was carried out by means of XRD, TEM, XPS and Raman scattering spectroscopy. The experimental results indicate that the as-prepared powders are composed of ZnSe with zinc-blende structure. The high purity of ZnSe particles was confirmed by XPS analysis. In the Raman spectra, TO and LO phonon modes were observed at 205 and 257 cm−1 in the ZnSe nanoparticles.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 536: Symposium F – Microcrystalline & Nanocrystalline Semiconductors - 1998 , 1998 , 401
Copyright
Copyright © Materials Research Society 1999

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References

1. Averin, D. V., Korotkov, A. N., and Likharev, K. K., Phys. Rev. B 44, 6199 (1991).Google Scholar
2. Li, G. and Nogami, M., J. Appl. Phys. 75, 4276 (1994).Google Scholar
3. Haggata, S. W., Cole-Hamilton, D. J. and Fryer, J. R., J. Mater. Chem. 7, 1969 (1997).Google Scholar
4. Xu, J. F., Ji, W., Lin, J. Y., Tang, S. H., and Du, Y. W., Appl. Phys. A 66, 639 (1998).Google Scholar
5. Major, S., Kumar, S., Bhatnagar, M., and Chopra, K. L., Appl. Phys. Lett. 49, 394 (1986).Google Scholar
6. Xu, J. F., Ji, W., Wang, X. B., Shu, H., Shen, Z. X. and Tang, S. H., J. Raman Spectrosc. 29, 639 (1998).Google Scholar
7. Mitra, S. S., Brafman, O., Daniels, W. B., and Crawford, R. K., Phys. Rev. 186, 942 (1969).Google Scholar