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Characterization of Thin Polymer Blend Films using ESEM – No Charging, No Staining.
Published online by Cambridge University Press: 21 March 2011
Abstract
Characterising the morphology of thin films for use in device applications requires the ability to study both the structure within the plane of the film, and also through its thickness. Environmental scanning electron microscopy has proved to be a fruitful technique for the study of such films both because contrast can be seen within the film without the need for staining (as is conventionally done for electron microscopy), and because cross-sectional images can be obtained without charging artefacts. The application of ESEM to a particular blend of relevance to photovoltaics is described.
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 707: Symposium AA – Self-Assemble Processes in Materials , 2001 , AA10.8.1/DD11.8.1
- Copyright
- Copyright © Materials Research Society 2002
References
REFERENCES
1.
Arias, A C, MacKenzie, J, Stevenson, R et al., “Photovoltaic Performance and Morphology of Polyfluorene Blends: A Combined Microscopic and Photovoltaic Investigation,” Macromolecules
34, 6005–13 (2001).Google Scholar
2.
Arias, A-C, “Conjugated polymer phase separation and three dimensional thin film structure for photovoltaics,” PhD, Cambridge University, 2001.Google Scholar
3.
Danilatos, G D, “Review and outline of environmental SEM at present,” J. Microscopy
162, 391–402 (1990).Google Scholar
4.
Stokes, D J, Thiel, B L, and Donald, A M, “Direct observation of water-oil emulsion systems in the liquid stated by environmental SEM,” Langmuir
14, 4402–8 (1998).Google Scholar