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Characterization of Thin Polymer Blend Films using ESEM – No Charging, No Staining.

Published online by Cambridge University Press:  21 March 2011

Ian C. Bache
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
Catherine M. Ramsdale
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
D. Steve Thomas
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
Ana-Claudia Arias
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
J. Devin MacKenzie
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
Richard H. Friend
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
Neil C. Greenham
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
Athene M. Donald
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge CB3 0HE, UK
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Abstract

Characterising the morphology of thin films for use in device applications requires the ability to study both the structure within the plane of the film, and also through its thickness. Environmental scanning electron microscopy has proved to be a fruitful technique for the study of such films both because contrast can be seen within the film without the need for staining (as is conventionally done for electron microscopy), and because cross-sectional images can be obtained without charging artefacts. The application of ESEM to a particular blend of relevance to photovoltaics is described.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

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