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Characterization of the order-annealing response of nanostructured iron-palladium based ferromagnetic thin-films

Published online by Cambridge University Press:  15 March 2011

Huiping Xu ,
Adam T. Wise ,
Timothy J. Klemmer  and
Jörg M. K. Wiezorek
Huiping Xu
Affiliation:
Department of Materials Science & Engineering, University of Pittsburgh, 848 Benedum Hall, Pittsburgh, PA 15261, USA
Adam T. Wise
Affiliation:
Department of Materials Science & Engineering, University of Pittsburgh, 848 Benedum Hall, Pittsburgh, PA 15261, USA
Timothy J. Klemmer
Affiliation:
Seagate Technology, 2403 Sidney Street, Pittsburgh, PA 15203, USA
Jörg M. K. Wiezorek
Affiliation:
Department of Materials Science & Engineering, University of Pittsburgh, 848 Benedum Hall, Pittsburgh, PA 15261, USA
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Abstract

A combination of XRD and TEM techniques have been used to characterize the response of room temperature magnetron sputtered Fe-Pd thin films on Si-susbtrates to post-deposition order-annealing at temperatures between 400-500°C. Deposition produced the disordered Fe-Pd phase with (111)-twinned grains approximately 18nm in size. Ordering occurred for annealing at 450°C and 500°C after 1.8ks, accompanied by grain growth (40-70nm). The ordered FePd grains contained (111)-twins rather than {101}-twins typical of bulk ordered FePd. The metallic overlayers and underlayers selected here produced detrimental dissolution (Pt into Fe-Pd phases) and precipitation reactions between Pd and the Si substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 703: Symposia U/V – Nanophase and Nanocomposite Materials IV , 2001 , V3.4
Copyright
Copyright © Materials Research Society 2002

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References

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