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Characterization of Quantum Heterostructures. A Simulation Method Combining the Evaluation of Lattice and Electrons Configuration and TEM Imaging.
Published online by Cambridge University Press: 15 February 2011
Abstract
This work analyzes the characterization of the structural properties of quantum heterostructures by HREM. A simulation of atomistic type is used to construct a Fe/Ag bilayer few nm thick and the HREM image of this structure is calculated by using a standard dynamical diffraction method. The comparison of the two calculations indicates that the interfacial disorder spans few layers and can be resolved against the background of two well-registered lattices.
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- Copyright © Materials Research Society 1995