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Characterization of Nanoparticle Films and Structures Produced by Hypersonic Plasma Particle Deposition

Published online by Cambridge University Press:  11 February 2011

Christopher R. Perrey
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. S.E., Minneapolis, MN 55455
Ryan Thompson
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. S.E., Minneapolis, MN 55455
C. Barry Carter*
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. S.E., Minneapolis, MN 55455
Ashok Gidwani
Affiliation:
Department of Mechanical Engineering, University of Minnesota, 111 Church Street, S.E., Minneapolis, MN 55455
Rajesh Mukherjee
Affiliation:
Department of Mechanical Engineering, University of Minnesota, 111 Church Street, S.E., Minneapolis, MN 55455
Thierry Renault
Affiliation:
Department of Mechanical Engineering, University of Minnesota, 111 Church Street, S.E., Minneapolis, MN 55455
P. H. McMurry
Affiliation:
Department of Mechanical Engineering, University of Minnesota, 111 Church Street, S.E., Minneapolis, MN 55455
J. V. R. Heberlein
Affiliation:
Department of Mechanical Engineering, University of Minnesota, 111 Church Street, S.E., Minneapolis, MN 55455
S. L. Girshick
Affiliation:
Department of Mechanical Engineering, University of Minnesota, 111 Church Street, S.E., Minneapolis, MN 55455
*
* corresponding author: [email protected]
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Abstract

There is great potential for the use of nanostructures in numerous applications. Investigation of nanoparticle films and structures is an important area of research for the production of nanoengineered devices. However, for these devices to become a reality, a production method that can yield high-rate synthesis of nanostructured powders is necessary. The hypersonic plasma particle deposition (HPPD) process has been shown to be capable of such high-rate production of nanoparticle films and structures. Versatile in its ability to manufacture nanoparticles of different chemistries HPPD also has the capability of in situ particle consolidation and assembly. In this study, chemically diverse films and structures have been produced by HPPD on a variety of substrates. Using novel specimen preparation techniques, these nanoparticles have been characterized by TEM. Fundamental issues of importance have been investigated for both the nanoparticle structure and the constituent nanoparticles. These issues include nanoparticle crystallinity and defect structure. The chemical homogeneity and structural characteristics of the deposition are also investigated. This application of microscopy to aid process development has resulted in insights into the nanoparticle formation process and the dynamics of the HPPD process.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Siegel, R.W.. Materials Science and Engineering 1993;A168: 189.Google Scholar
2. Gleiter, H.. Progress in Materials Science 1989;33: 223315.Google Scholar
3. Rao, N.P., Tymiak, N., Blum, J., Neuman, A., Lee, H.J., Girshick, S.L., McMurry, P.H. and Heberlein, J.. Journal of Aerosol Science 1998;29: 707720.Google Scholar
4. Blum, J., Tymiak, N., Neuman, A., Wong, Z., Rao, N.P., Girshick, S.L., Gerberich, W.W., McMurry, P.H. and Heberlein, J.V.R.. Journal of Nanoparticle Research 1999;1: 31.Google Scholar
5. DiFonzo, F., Gidwani, A., Fan, M.H., Neumann, D., Iordanoglou, D.I., Heberlein, J.V.R., McMurry, P.H., Girshick, S.L., Tymaik, N., Gerberich, W.W. and Rao, N.P.. Applied Physics Letters 2000;77: 910912.Google Scholar
6. Stevie, F.A., Vartulo, C.B., Giannuzzi, L.A., Shofner, T.L., Brown, S.R., Rossie, B., Hillion, F., Mills, R.H., Antonell, M., Irwin, R.B. and Purcell, B.M.. Surface and Interface Analysis 2001;31: 345351.Google Scholar
7. Lomness, J.K., Giannuzzi, L.A. and Hampton, M.D.. Microscopy and Microanalysis 2001;7: 418423.Google Scholar
8. Longo, D.M., Howe, J.M. and Johnson, W.C.. Ultramicroscopy 1999;80: 6984.Google Scholar
9. Yaguchi, T., Matsumoto, H., Kamino, T., Ishitani, T. and Urao, R.. Microscopy and Microanalysis 2001;7: 287291.Google Scholar
10. Grabar, K.C., Brown, K.R., Keating, C.D., Stranick, S.J., Tang, S.-L. and Natan, M.J.. Analytical Chemistry 1997;69: 471477.Google Scholar
11. Williams, D.B. and Carter, C.B.. Transmission Electron Microscopy, Plenum Press, New York (1996).Google Scholar
12. Perrey, C.R., Carter, C.B., Kotula, P.G. and Michael, J.R.. Microscopy and Microanalysis 2002;8: 1144CD.Google Scholar