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Characterization of Indium Sulfide Thin Films Containing Copper

Published online by Cambridge University Press:  31 January 2011

Nicolas Barreau
Affiliation:
[email protected], Institut des Matériaux Jean Rouxel, 2 rue de la Houssinière, BP 32229, Nantes, 44322, France
Mickael Tessier
Affiliation:
[email protected], IMN, Nantes, France
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Abstract

The crystalline, optical and electrical properties of In2S3 containing copper thin films are investigated. Increasing the amount of copper within the In2S3 crystalline matrix yields reduced bandgap value and hindered conductivity. The films investigated being synthesized at low temperature (200 °C), it is likely they have similar properties as the materials formed at the CuIn1-xGaxSe2/In2S3 interface.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

1. Hariskos, D. Spiering, S. Powalla, M. Thin Solid Films 480-481, 99(2005).Google Scholar
2. Pistor, P. Caballero, R. Hariskos, D. Izquierdo-Roca, V., Wächter, R., Schorr, S. Klenk, R. Sol. En. Mat. And Sol. Cells 93, 148(2009).Google Scholar
3. Abou-Ras, B., Kostorz, G. Hariskos, D. Menner, R. Powalla, M. Schorr, S. Tiwari, A.N. Thin Sold Films 517, 2792(2009).Google Scholar
4. Naghavi, N. Spiering, S. Powalla, M. Cavana, B. and Lincot, D. Prog. Photovolt: Res. Appl. 11, 437(2003).Google Scholar
5. Buecheler, S. Corica, D. Guettler, D. Chirila, A. Verma, R. Müller, U., Niesen, T.P. Palm, J. Tiwari, A.N. Thin Solid Films 517, 2312(2009).Google Scholar
6. Allsop, N.A. Schönmann, A., Muffler, H.J. Bär, M., Lux-Steiner, M.C. and Fischer, Ch.H., Prog. Photovolt: Res. Appl. 13, 607(2005).Google Scholar
7. Guillot-Deudon, C., Harel, S. Mokrani, A. Lafond, A. Barreau, N. Fernandez, V. Kessler, J. Physical Review B 78 235201 (2008).Google Scholar
8.Jacques Pankove, I. Optical processes in semiconductors, Dover Publications, Inc., New York, NY.Google Scholar
9.JCPDS -International Centre for Diffraction Data # 65-0459Google Scholar
10.JCPDS-International Centre for Diffraction Data # 24-0361Google Scholar
11. Migge, H. Grzanna, J. J. Mat. Res. 9 125 (1994).Google Scholar